Abstract: A tire protection mount may include a bracket that includes a central platform and an arm. The central platform is connected the arm to define an opening. The tire protection mount further includes a shield connected to the bracket that substantially covers the opening.

Abstract: A tire protection mount may include a bracket that includes a central platform and an arm. The central platform is connected the arm to define an opening. The tire protection mount further includes a shield connected to the bracket that substantially covers the opening.

Abstract: Method for matching of a repair paint to texture properties and optionally colour of a paint film on a substrate to be repaired characterized in that a database is used of paint modules with specified texture data, which are used to calculate expected texture of a combination of modules on basis of concentrations of the paint modules.

Abstract: A method for monitoring polishing process parameters for an integrated circuit structure on a substrate. A first metrology site is constructed on the substrate. The first metrology site represents a design extreme of a high density integrated circuit structure. The first metrology site is formed by placing a relatively small horizontal surface area trench within a relatively large surface area field of a polish stop material. A second metrology site is also constructed on the substrate. The second metrology site represents a design extreme of a low density integrated circuit structure. The second metrology site is formed by placing a relatively large horizontal surface area trench within a relatively small surface area field of a polish stop material. The substrate is covered with a layer of an insulating material, thereby at least filling the trenches.