Patents by Inventor Eric LAHAYE

Eric LAHAYE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11982547
    Abstract: Method of determining a position of a sensor device relative to a magnetic source, includes: a) determining a first and a second magnetic field component at a first sensor location; b) determining a third and a fourth magnetic field component at a second sensor location; c) determining a first difference of the first and third component, and determining a second difference of the second and fourth component, and determining a first angle based on a ratio of the first and second difference; d) determining a first sum of the first and third component, and determining a second sum of the second and fourth component; e) determining a second angle based on a ratio of said first and second sum; f) comparing the first and second angle to detect error.
    Type: Grant
    Filed: January 31, 2023
    Date of Patent: May 14, 2024
    Assignee: MELEXIS TECHNOLOGIES SA
    Inventors: Gael Close, Eric Lahaye, Lionel Tombez
  • Publication number: 20240133978
    Abstract: A method of determining an orientation of a magnet which is pivotable about a reference position having a predefined position relative to a silicon substrate, includes: providing a silicon substrate; determining a first/second magnetic field gradient along a first/second direction; determining a first/second angle based on said first/second magnetic field gradient and a first/second correction value. A sensor device configured for performing this method. A sensor system includes such sensor device and a magnet, optionally connected to a joystick.
    Type: Application
    Filed: October 16, 2023
    Publication date: April 25, 2024
    Inventors: Lionel TOMBEZ, Nicolas DUPRE, Eric LAHAYE
  • Patent number: 11849650
    Abstract: A sensor device comprising: a lead frame; a first/second semiconductor die having a first/second sensor structure at a first/second sensor location, and a plurality of first/second bond pads electrically connected to the lead frame; the semiconductor dies having a square or rectangular shape with a geometric center; the sensor locations are offset from the geometrical centers; the second die is stacked on top of the first die, and is rotated by a non-zero angle and optionally also offset or shifted with respect to the first die, such that a perpendicular projection of the first and second sensor location coincide.
    Type: Grant
    Filed: October 7, 2020
    Date of Patent: December 19, 2023
    Assignee: MELEXIS TECHNOLOGIES SA
    Inventors: Arnaud Laville, Eric Lahaye, Jian Chen
  • Publication number: 20230371401
    Abstract: A sensor device comprising: a lead frame; a first/second semiconductor die having a first/second sensor structure at a first/second sensor location, and a plurality of first/second bond pads electrically connected to the lead frame; the semiconductor dies having a square or rectangular shape with a geometric center; the sensor locations are offset from the geometrical centers; the second die is stacked on top of the first die, and is rotated by a non-zero angle and optionally also offset or shifted with respect to the first die, such that a perpendicular projection of the first and second sensor location coincide.
    Type: Application
    Filed: July 13, 2023
    Publication date: November 16, 2023
    Inventors: Arnaud LAVILLE, Eric LAHAYE, Jian CHEN
  • Publication number: 20230240153
    Abstract: A sensor device comprising: a lead frame; a first/second semiconductor die having a first/second sensor structure at a first/second sensor location, and a plurality of first/second bond pads electrically connected to the lead frame; the semiconductor dies having a square or rectangular shape with a geometric center; the sensor locations are offset from the geometrical centers; the second die is stacked on top of the first die, and is rotated by a non-zero angle and optionally also offset or shifted with respect to the first die, such that a perpendicular projection of the first and second sensor location coincide.
    Type: Application
    Filed: April 3, 2023
    Publication date: July 27, 2023
    Inventors: Arnaud LAVILLE, Eric LAHAYE, Jian CHEN
  • Publication number: 20230184566
    Abstract: Method of determining a position of a sensor device relative to a magnetic source, includes: a) determining a first and a second magnetic field component at a first sensor location; b) determining a third and a fourth magnetic field component at a second sensor location; c) determining a first difference of the first and third component, and determining a second difference of the second and fourth component, and determining a first angle based on a ratio of the first and second difference; d) determining a first sum of the first and third component, and determining a second sum of the second and fourth component; e) determining a second angle based on a ratio of said first and second sum; f) comparing the first and second angle to detect error.
    Type: Application
    Filed: January 31, 2023
    Publication date: June 15, 2023
    Inventors: Gael CLOSE, Eric LAHAYE, Lionel TOMBEZ
  • Patent number: 11592317
    Abstract: Method of determining a position of a sensor device relative to a magnetic source, includes: a) determining a first and a second magnetic field component at a first sensor location; b) determining a third and a fourth magnetic field component at a second sensor location; c) determining a first difference of the first and third component, and determining a second difference of the second and fourth component, and determining a first angle based on a ratio of the first and second difference; d) determining a first sum of the first and third component, and determining a second sum of the second and fourth component; e) determining a second angle based on a ratio of said first and second sum; f) comparing the first and second angle to detect error.
    Type: Grant
    Filed: May 20, 2022
    Date of Patent: February 28, 2023
    Assignee: MELEXIS TECHNOLOGIES SA
    Inventors: Gael Close, Eric Lahaye, Lionel Tombez
  • Publication number: 20220381586
    Abstract: Method of determining a position of a sensor device relative to a magnetic source, includes: a) determining a first and a second magnetic field component at a first sensor location; b) determining a third and a fourth magnetic field component at a second sensor location; c) determining a first difference of the first and third component, and determining a second difference of the second and fourth component, and determining a first angle based on a ratio of the first and second difference; d) determining a first sum of the first and third component, and determining a second sum of the second and fourth component; e) determining a second angle based on a ratio of said first and second sum; f) comparing the first and second angle to detect error.
    Type: Application
    Filed: May 20, 2022
    Publication date: December 1, 2022
    Inventors: Gael CLOSE, Eric LAHAYE, Lionel TOMBEZ
  • Publication number: 20210111335
    Abstract: A sensor device comprising: a lead frame; a first/second semiconductor die having a first/second sensor structure at a first/second sensor location, and a plurality of first/second bond pads electrically connected to the lead frame; the semiconductor dies having a square or rectangular shape with a geometric center; the sensor locations are offset from the geometrical centers; the second die is stacked on top of the first die, and is rotated by a non-zero angle and optionally also offset or shifted with respect to the first die, such that a perpendicular projection of the first and second sensor location coincide.
    Type: Application
    Filed: October 7, 2020
    Publication date: April 15, 2021
    Inventors: Arnaud LAVILLE, Eric LAHAYE, Jian CHEN