Patents by Inventor Eric M. Frey

Eric M. Frey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5844675
    Abstract: An interchangeable clamp plate is designed to receive and hold a magnetic-head suspension in a predetermined position in a test clamp of a pitch and roll measuring instrument. The clamp plate comprises a support plate for securing the swage mount of the suspension to a predetermined reference plane and a reference surface integrally formed coplanarly with the support plate in a position within the normal operating range of the optics of the instrument. Each kind of suspension being tested is mounted on a clamp plate conforming to its specific geometry that is adapted for installation in the test instrument prior to measurement. As a result of this configuration, once the instrument is calibrated with respect to the reference surface coplanar with the swage mounting surface, measurement accuracy is inherently maintained during testing.
    Type: Grant
    Filed: May 30, 1997
    Date of Patent: December 1, 1998
    Assignee: Wyko Corporation
    Inventors: John B. Hayes, Eric M. Frey
  • Patent number: 5483064
    Abstract: A scanning microscope wherein the probe operates at all times in alignment with the piezoelectric element providing the scanning motion. A sample is slidably connected to the piezoelectric element and the target area on the sample is positioned substantially coaxially with the probe and the scanning element prior to commencement of the scanning operation. A particular embodiment of a sample positioner is provided that eliminates any interference by the positioner with the sample during scanning.
    Type: Grant
    Filed: January 21, 1994
    Date of Patent: January 9, 1996
    Assignee: Wyko Corporation
    Inventors: Eric M. Frey, Norman E. Ragan, Jr.
  • Patent number: 5200617
    Abstract: A scanning probe microscope includes a base, an inner piezoelectric tube, and an outer PMN translator arrangement including three PMN posts, with first ends of the PMN posts connected to the base. A first end of the inner piezoelectric tube is rigidly connected to second ends of the PMN posts. Inner quadrant conductors are disposed on the inner surfaces of the inner piezoelectric tube, and outer quadrant conductors are disposed on the outer surfaces of the inner piezoelectric tube. Separate x and y scan control voltage signals are applied to corresponding opposed quadrant conductors of the inner piezoelectric tube to control scanning of the free end of the inner tube in the x and y directions. A z scan control voltage is produced by a servo control circuit in response to a probe signal and applied to the PMN posts, which have negligible hysteresis. The servo control circuit refers to a look-up table to correct non-linearities of the PMN posts.
    Type: Grant
    Filed: August 13, 1992
    Date of Patent: April 6, 1993
    Assignee: Wyko Corporation
    Inventors: John B. Hayes, Jamshid Jahanmir, Eric M. Frey
  • Patent number: 5173605
    Abstract: A scanning probe microscope includes a base, an inner piezoelectric tube, and an outer piezoelectric tube, with a first end of the outer piezoelectric tube connected to the base. A first end of the inner piezoelectric tube is rigidly connected to a second end of the outer piezoelectric tube. Thin inner conductors are disposed on the inner surfaces of the inner piezoelectric tube and the outer piezoelectric tube, and quadrant conductors are disposed on the outer surfaces of the inner piezoelectric tube and the outer piezoelectric tube. Separate x, y, and z scan control voltage signals are applied to various quadrant conductors of the inner and outer piezoelectric tubes to control scanning of the free end of the inner tube in the x, y, and z directions, respectively.
    Type: Grant
    Filed: March 9, 1992
    Date of Patent: December 22, 1992
    Assignee: Wyko Corporation
    Inventors: John B. Hayes, Jamshid Jahanmir, Eric M. Frey
  • Patent number: 5103094
    Abstract: A scanning probe microscope includes a base, an inner piezoelectric tube, and an outer piezoelectric tube, with a first end of the outer piezoelectric tube connected to the base. A first end of the inner piezoelectric tube is rigidly connected to a second end of the outer piezoelectric tube. Thin inner conductors are disposed on the inner surfaces of the inner piezoelectric tube and the other piezoelectric tube, and quadrant conductors are disposed on the outer surfaces of the inner piezoelectric tube and the outer piezoelectric tube. Variable voltages are applied to the quadrant conductors of the outer piezoelectric tube and the inner piezoelectric tube and varied to cause lateral and axial movement of the second end of the outer piezoelectric tube and also to cause lateral and perpendicular movement of the second end of the inner piezoelectric tube relative to its first end.
    Type: Grant
    Filed: May 2, 1991
    Date of Patent: April 7, 1992
    Assignee: Wyko Corporation
    Inventors: John B. Hayes, Jamshid Jahanmir, Eric M. Frey
  • Patent number: 5044312
    Abstract: A mask for protecting edge conductors of printed circuit boards from the spray coating which is sprayed on the board. The mask is molded from a soft silicone-based-elastomer material in a configuration which presents a sharp sealing edge and a large interior angle adjacent the seal which effectively limits migration due to capillary action.
    Type: Grant
    Filed: November 7, 1989
    Date of Patent: September 3, 1991
    Assignee: Hughes Aircraft Company
    Inventors: Bryan W. Guenther, Eric M. Frey
  • Patent number: 5023848
    Abstract: A pair of spaced apart probes generally approximating the contact geometry of conveyed object to be wave soldered is similarly conveyed past and in contact with the solder wave. A timing circuit interconnects with the probes and measures the dwell time of the pair of probes in contact with the solder wave. The probes may have different shaped solder wave contacting parts (e.g., linear edge, points).
    Type: Grant
    Filed: May 15, 1989
    Date of Patent: June 11, 1991
    Assignee: Highes Aircraft Company
    Inventors: Eric M. Frey, Joseph A. Lamb
  • Patent number: 4911046
    Abstract: A multiple die is used to trim a plurality of electrical component leads, all at the same time, by using a die and a hydraulic press to develop a shearing action. Male and female die members each define a pattern of holes arrayed to mate with the configuration of leads extending from an electronic package. Near the upper face of the female die member, a plurality of tiny O-rings are mounted, one for each lead, encircling the paths for the leads as the package is positioned atop the die. The transverse relative motion between the male and female members of the die shears the leads while the O-rings serve to isolate and limit the amount of shock and vibration that can be transmitted along the leads.
    Type: Grant
    Filed: March 16, 1989
    Date of Patent: March 27, 1990
    Assignee: Hughes Aircraft Company
    Inventors: Steven R. Goss, Eric M. Frey