Patents by Inventor Eric M. Walstra

Eric M. Walstra has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8390826
    Abstract: A method and apparatus that linearly scans at least one plane of radiation having a width wider than the diameter of the part onto an exterior side surface of the supported part so that the part occludes the at least one plane of radiation at a plurality of spaced apart locations. The invention includes forming a virtual representation of an outer profile of the part in a reference frame based on the input data and providing a virtual representation of an inner bore of a physical gauge in the reference frame. Then determining an interference position between the part and the gauge using the virtual representations wherein the interference position is a position along the axis where the bore diameter is substantially equal to the part diameter. Finally calculating a distance along the axis based on the interference position and storing the distance.
    Type: Grant
    Filed: April 20, 2011
    Date of Patent: March 5, 2013
    Assignee: GII Acquisition, LLC
    Inventor: Eric M. Walstra
  • Publication number: 20120268748
    Abstract: A method for optically inspecting a part having a length, a diameter and an axis is provided. The method includes supporting the part. The method further includes linearly scanning at least one plane of radiation having a width wider than the diameter of the part onto an exterior side surface of the supported part so that the part occludes the at least one plane of radiation at a plurality of spaced apart locations along the axis to create unobstructed left and right planar portions of the at least one plane of radiation passing by and not blocked by the part. The unobstructed left and right planar portions contain an amount of radiation which is representative of a respective diameter of the part at the plurality of spaced apart locations.
    Type: Application
    Filed: April 20, 2011
    Publication date: October 25, 2012
    Applicant: GII ACQUISITION, LLC DBA GENERAL INSPECTION, LLC
    Inventor: Eric M. Walstra
  • Patent number: 7796278
    Abstract: A method for precisely measuring position of a part to be inspected at a part inspection station is provided. The method includes positioning a part having a part axis relative to a measurement axis at the part inspection station and scanning the positioned part with an array of planes of radiation so that the part occludes each of the planes of radiation over a measurement interval of the part to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method also includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals and processing the measurement signals to obtain a geometric measurement between the axes at the measurement interval. The geometric measurement may be a distance between the axes or angle between the axes.
    Type: Grant
    Filed: September 19, 2008
    Date of Patent: September 14, 2010
    Assignee: GII Acquisition, LLC
    Inventors: John D. Spalding, Eric M. Walstra
  • Publication number: 20100073687
    Abstract: A method for precisely measuring position of a part to be inspected at a part inspection station is provided. The method includes positioning a part having a part axis relative to a measurement axis at the part inspection station and scanning the positioned part with an array of planes of radiation so that the part occludes each of the planes of radiation over a measurement interval of the part to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method also includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals and processing the measurement signals to obtain a geometric measurement between the axes at the measurement interval. The geometric measurement may be a distance between the axes or angle between the axes.
    Type: Application
    Filed: September 19, 2008
    Publication date: March 25, 2010
    Applicant: GII Acquisition, LLC dba General Inspection, LLC
    Inventors: John D. Spalding, Eric M. Walstra