Abstract: A method, according to one approach, includes: detecting a failed phase of a first VRM which causes the first VRM to have a number of functioning phases that is outside a predetermined range. The first VRM is included in a processor system architecture having a plurality of VRMs respectively associated with a plurality of chips. The method also includes causing any workloads on a first chip associated with the first VRM to be offloaded. Moreover, a controlled shutdown of the first VRM and the first chip is performed, while the plurality of VRMs respectively associated with the plurality of chips in the processor system architecture, excluding the first VRM and the first chip, remain operational.

Abstract: Data relating to one or more circuit paths may be collected during a design stage of a processor chip based on a design model. One or more delta values may be added to the one or more circuit paths of the design model. One or more broken circuit paths may be identified based on the one or more delta values. A target time for each of the one or more broken circuit paths may be adjusted.

Abstract: Providing deterministic frequency and voltage enhancements for a processor is disclosed. In an embodiment, a microcontroller on a processor identifies a plurality of parameters related to a processor, the plurality of parameters including at least a current supplied to the processor; determines, in dependence upon the plurality of parameters, one or more frequency scaling indexes including determining an effective switching capacitance ratio; identifies, in dependence upon the one or more frequency scaling indexes, a predetermined frequency parameter for the processor; and transitions, based on the frequency parameter, the processor to a target clock frequency.

Abstract: Data relating to one or more circuit paths may be collected during a design stage of a processor chip based on a design model. One or more delta values may be added to the one or more circuit paths of the design model. One or more broken circuit paths may be identified based on the one or more delta values. A target time for each of the one or more broken circuit paths may be adjusted.

Abstract: Providing deterministic frequency and voltage enhancements for a processor is disclosed. In an embodiment, a microcontroller on a processor identifies a plurality of parameters related to a processor, the plurality of parameters including at least a current supplied to the processor; determines, in dependence upon the plurality of parameters, one or more frequency scaling indexes including determining an effective switching capacitance ratio; identifies, in dependence upon the one or more frequency scaling indexes, a predetermined frequency parameter for the processor; and transitions, based on the frequency parameter, the processor to a target clock frequency.

Abstract: Thermal control of a multi-chip module in an operating environment is facilitated by predetermining separate thermal control points for multiple chips of the multi-chip module, with a first chip and a second chip having different predetermined thermal control points, and saving the predetermined thermal control points for reference by a thermal control of the multi-chip module in an operating environment. The thermal control monitors an operating temperature of the first chip, and compares the operating temperature of the first chip to the predetermined thermal control point of that chip. The thermal control further initiates a control action to control temperature of the first chip based on comparing the operating temperature of the first chip to the predetermined thermal control point of the first chip.

Abstract: Thermal control of a multi-chip module in an operating environment is facilitated by predetermining separate thermal control points for multiple chips of the multi-chip module, with a first chip and a second chip having different predetermined thermal control points, and saving the predetermined thermal control points for reference by a thermal control of the multi-chip module in an operating environment. The thermal control monitors an operating temperature of the first chip, and compares the operating temperature of the first chip to the predetermined thermal control point of that chip. The thermal control further initiates a control action to control temperature of the first chip based on comparing the operating temperature of the first chip to the predetermined thermal control point of the first chip.

Abstract: Embodiments of the invention are directed to a method and resulting structures for identifying an integrated circuit (IC) chip using optically-unique features. In a non-limiting embodiment of the invention, an imaging device generates an image of the chip. One or more optical features of the chip within the image can be determined and stored in a local or remote database. Metadata associated with the chip can be generated and linked with the one or more optical features of the chip and a unique identifier of the chip in the database.

Abstract: Embodiments of the invention are directed to a method and resulting structures for identifying an integrated circuit (IC) chip using optically-unique features. In a non-limiting embodiment of the invention, an imaging device generates an image of the chip. One or more optical features of the chip within the image can be determined and stored in a local or remote database. Metadata associated with the chip can be generated and linked with the one or more optical features of the chip and a unique identifier of the chip in the database.