Patents by Inventor Eric N. Flink
Eric N. Flink has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7080398Abstract: Channel and test plans are implemented in connection with a plurality of nodes that communicate signals. The channel plan enables a monitoring system to, among other things, conduct automatic periodic test plans, comprising tests, on the nodes, based upon the predefined data specified in the channel plan. The monitoring system includes a controller controlling a spectrum analyzer and a node interface switch. Notably, the controller also enables user friendly plan set-up and warning interface logic implementation. The warning interface logic generates a channel percent advisory indicator on the display device within a channel level interface component upon an occurrence of an advisory event in a channel associated therewith and generates a channel critical alarm indicator on the display device within a channel level interface component upon an occurrence of a critical event in a channel associated therewith.Type: GrantFiled: November 30, 1999Date of Patent: July 18, 2006Assignee: Agilent Technologies, Inc.Inventors: James Wichelman, Bruce Votipka, Eric N. Flink, Craig Chamberlain, Jan Ryles
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Patent number: 7050401Abstract: A channel plan with a corresponding test plan are implemented in connection with a plurality of nodes that communicate signals. The channel plan has one or more predefined specifications for each of one or more signal channels on each of the nodes. The channel plan may comprise a specification of the following, for example, for each of the channels: a label describing use of the corresponding channel, a center frequency, a bandwidth, a power level, information regarding the carrier roll-off, a default status indicator identifying whether the corresponding channel is currently allocated or reserved for future use, one or more default threshold levels for various tests, and an alternate center frequency that may be utilized by the corresponding channel. The channel plan enables a monitoring system to, among other things, conduct automatic periodic test plans, comprising tests, on the nodes, based upon the predefined data specified in the channel plan.Type: GrantFiled: November 30, 1999Date of Patent: May 23, 2006Assignee: Agilent Technologies, Inc.Inventors: James Wichelman, Bruce Votipka, Eric N. Flink, Craig Chamberlain, Jan Ryles
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Patent number: 7003414Abstract: A channel plan with a corresponding test plan are implemented in connection with a plurality of nodes that communicate signals. The channel plan has one or more predefined specifications for each of one or more signal channels on each of the nodes. The channel plan enables a monitoring system to, among other things, conduct automatic periodic test plans, comprising tests, on the nodes, based upon the predefined data specified in the channel plan. Each test plan prescribes measurement of at least one signal parameter, pertaining to one or more nodes as a whole and/or to one or more channels contained within the nodes. The monitoring system includes a spectrum analyzer, a switch enabling the spectrum analyzer to interface with the nodes, and a controller controlling the switch and the spectrum analyzer. The controller is configured to enable creation of and display the channel plan and test plan, based upon user inputs.Type: GrantFiled: November 30, 1999Date of Patent: February 21, 2006Assignee: Agilent Technologies, Inc.Inventors: James Wichelman, Bruce Votipka, Eric N. Flink, Craig Chamberlain
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Patent number: 6853932Abstract: A channel plan with a corresponding test plan are implemented in connection with a plurality of nodes that communicate signals. The channel plan has one or more predefined specifications for each of one or more signal channels on each of the nodes. The channel plan may comprise a specification of the following, for example, for each of the channels: a label describing use of the corresponding channel, a center frequency, a bandwidth, a power level, information regarding the carrier roll-off, a default status indicator identifying whether the corresponding channel is currently allocated or reserved for future use, one or more default threshold levels for various tests, and an alternate center frequency that may be utilized by the corresponding channel. The channel plan enables a monitoring system to, among other things, conduct automatic periodic test plans, comprising tests, on the nodes, based upon the predefined data specified in the channel plan.Type: GrantFiled: November 30, 1999Date of Patent: February 8, 2005Assignee: Agilent Technologies, Inc.Inventors: James Wichelman, Bruce Votipka, Eric N. Flink, Craig Chamberlain
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Patent number: 6741947Abstract: A system includes a plurality of nodes. The plurality of nodes each communicate signals pursuant to a single channel plan. The channel plan includes predefined characteristics for each of a plurality of signal channels. The system further includes a spectrum analyzer, a switch, and a controller. The switch connects the spectrum analyzer to the nodes. The controller tests communication signals on at least one of the nodes by conducting a test plan. The test plan prescribes performance of at least an average power test. The controller also derives a total node power based on the average power test results.Type: GrantFiled: November 30, 1999Date of Patent: May 25, 2004Assignee: Agilent Technologies, Inc.Inventors: James Wichelman, Craig Chamberlain, Eric N. Flink
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Patent number: 6732061Abstract: A system includes a plurality of nodes. The plurality of nodes each communicate signals pursuant to a channel plan. The channel plan includes one or more predefined specifications for each of one or more signal channels on each of the plurality of nodes.Type: GrantFiled: November 30, 1999Date of Patent: May 4, 2004Assignee: Agilent Technologies, Inc.Inventors: James Wichelman, Bruce Votipka, Eric N. Flink, Craig Chamberlain
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Patent number: 6711134Abstract: Channel and test plans are implemented in connection with a plurality of nodes that communicate signals. The channel plan has one or more predefined specifications for each of one or more signal channels on each of the nodes. The channel plan enables a monitoring system to generate and conduct automatic periodic node test plans based upon the predefined specifications. Each test plan prescribes measurement of at least one node and/or channel signal parameter. The monitoring system includes a spectrum analyzer, a switch enabling the spectrum analyzer to interface with the nodes, and a controller. The controller is configured to enable creation of and display the channel plan and test plan, and to automate the node testing. The test plan may include alarm thresholds that are triggered and tracked when a signal parameter of a node or channel exceeds an alarm threshold.Type: GrantFiled: November 30, 1999Date of Patent: March 23, 2004Assignee: Agilent Technologies, Inc.Inventors: James Wichelman, Bruce Votipka, Eric N. Flink, Kathy Hertzog
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Patent number: 6643607Abstract: A channel plan and a corresponding test plan are implemented in connection with a plurality of nodes that communicate signals. The channel plan enables a monitoring system to conduct automatic periodic test plans, comprising tests, on the nodes, based upon data specified in the channel plan. Each test plan prescribes measurement of at least one signal parameter, pertaining to one or more nodes and/or one or more channels communicated across the nodes. The monitoring system includes a spectrum analyzer, a switch enabling the spectrum analyzer to interface with the nodes, and a controller. The controller causes periodic automatic testing of the signal characteristics of the nodes based upon the test plan and a smart scanning algorithm.Type: GrantFiled: November 30, 1999Date of Patent: November 4, 2003Assignee: Agilent Technologies, Inc.Inventors: Craig Chamberlain, Eric N. Flink, Bill Morgan
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Patent number: 6590587Abstract: A channel plan and a corresponding test plan are implemented in connection with a plurality of nodes that communicate signals. The channel plan enables a monitoring system to conduct automatic periodic test plans, comprising tests, on the nodes, based upon data specified in the channel plan. Each test plan prescribes measurement of at least one signal parameter, pertaining to one or more nodes and/or to one or more channels contained within the nodes. The monitoring system includes a spectrum analyzer, a switch enabling the spectrum analyzer to interface with the nodes, and a controller. Navigation interface logic is configured to generate a universal interface component on the display device, one or more group level interface components on the display device, one or more node level interface components on the display device, and one or more channel level interface components on the display device.Type: GrantFiled: November 30, 1999Date of Patent: July 8, 2003Assignee: Agilent Technologies, Inc.Inventors: James Wichelman, Eric N. Flink, Craig Chamberlain
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Patent number: 6522987Abstract: A channel plan with a corresponding test plan are implemented in connection with a plurality of nodes that communicate signals. The channel plan has one or more predefined specifications for each of one or more signal channels on each of the nodes. The channel plan enables a monitoring system to, among other things, conduct automatic periodic test plans, comprising tests, on the nodes, based upon the predefined data specified in the channel plan. Each test plan prescribes measurement of at least one signal parameter, pertaining to one or more nodes as a whole and/or to one or more channels contained within the nodes. The monitoring system includes a spectrum analyzer, a switch enabling the spectrum analyzer to interface with the nodes, and a controller controlling the switch and the spectrum analyzer. The controller is configured to enable creation of and display the channel plan and test plan, based upon user inputs.Type: GrantFiled: November 30, 1999Date of Patent: February 18, 2003Assignee: Agilent Technologies, Inc.Inventors: Eric N. Flink, Craig Chamberlain, Bill Morgan