Patents by Inventor Eric R. Trumbauer

Eric R. Trumbauer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6542282
    Abstract: A method of patterning a metal layer that cleans the residue from a metal etch process without removing a photoresist etch mask. The method is particularly useful for the fabrication of micromirror devices, or other MEMS devices that use photoresist spacer layers. A photoresist layer is spun on to the mirror metal layer in step 906. The photoresist is patterned and developed in step 908 to form openings to the metal layer. The openings define areas where the mirror metal layer will be removed. The patterned photoresist is inspected in step 910. The mirror metal layer is etched in step 912 using the patterned photoresist layer as an etch mask. After the mirror metal has been etched, the webbing and other residues are removed in a clean up process 914 that uses photoresist developer as a solvent to remove the webbing. After the developer clean up process, the mirrors are inspected in step 916 to verify the proper gaps have been etched between the mirrors and the removal of the mirror etch residue.
    Type: Grant
    Filed: December 31, 2001
    Date of Patent: April 1, 2003
    Assignee: Texas Instruments Incorporated
    Inventors: David M. Smith, Eric R. Trumbauer, Ronald C. Roth, Brian P. Scott
  • Publication number: 20020126368
    Abstract: A method of patterning a metal layer that cleans the residue from a metal etch process without removing a photoresist etch mask. The method is particularly useful for the fabrication of micromirror devices, or other MEMS devices that use photoresist spacer layers. A photoresist layer is spun on to the mirror metal layer in step 906. The photoresist is patterned and developed in step 908 to form openings to the metal layer. The openings define areas where the mirror metal layer will be removed. The patterned photoresist is inspected in step 910. The mirror metal layer is etched in step 912 using the patterned photoresist layer as an etch mask. After the mirror metal has been etched, the webbing and other residues are removed in a clean up process 914 that uses photoresist developer as a solvent to remove the webbing. After the developer clean up process, the mirrors are inspected in step 916 to verify the proper gaps have been etched between the mirrors and the removal of the mirror etch residue.
    Type: Application
    Filed: December 31, 2001
    Publication date: September 12, 2002
    Inventors: David M. Smith, Eric R. Trumbauer, Ronald C. Roth, Brian P. Scott