Patents by Inventor Eric R. Westphal

Eric R. Westphal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11079287
    Abstract: A method and system for determining temperature are provided. The method comprises using an x-ray source to irradiate a sample of a material with x-rays. Photon fluorescence produced by the sample in response to the x-ray irradiation is detected by a number of photon detectors. Based on the detected fluorescence a temperature of the sample is determined according to a predetermined relationship between photon fluorescence and temperature for the material.
    Type: Grant
    Filed: October 24, 2019
    Date of Patent: August 3, 2021
    Assignees: National Technology & Engineering Solutions of Sandia, LLC, Purdue Research Foundation
    Inventors: Kathryn N. Gabet Hoffmeister, Enrico C. Quintana, Walter Gill, Steven F. Son, Eric R. Westphal