Patents by Inventor Eric Seth Moderbacher

Eric Seth Moderbacher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods for automatic defect recognition
    Patent number: 11301977
    Abstract: An image inspection computing device is provided. The device includes a memory device and at least one processor. The at least one processor is configured to receive at least one sample image of a first component, wherein the at least one sample image of the first component does not include defects, store, in the memory, the at least one sample image, and receive an input image of a second component. The at least one processor is also configured to generate an encoded array based on the input image of the second component, perform a stochastic data sampling process on the encoded array, generate a decoded array, and generate a reconstructed image of the second component, derived from the stochastic data sampling process and the decoded array. The at least one processor is further configured to produce a residual image, and identify defects in the second component.
    Type: Grant
    Filed: April 10, 2020
    Date of Patent: April 12, 2022
    Assignee: General Electric Company
    Inventors: Alberto Santamaria-Pang, Yousef Al-Kofahi, Aritra Chowdhury, Shourya Sarcar, Michael John MacDonald, Peter Arjan Wassenaar, Patrick Joseph Howard, Bruce Courtney Amm, Eric Seth Moderbacher
  • SYSTEMS AND METHODS FOR AUTOMATIC DEFECT RECOGNITION
    Publication number: 20210319544
    Abstract: An image inspection computing device is provided. The device includes a memory device and at least one processor. The at least one processor is configured to receive at least one sample image of a first component, wherein the at least one sample image of the first component does not include defects, store, in the memory, the at least one sample image, and receive an input image of a second component. The at least one processor is also configured to generate an encoded array based on the input image of the second component, perform a stochastic data sampling process on the encoded array, generate a decoded array, and generate a reconstructed image of the second component, derived from the stochastic data sampling process and the decoded array. The at least one processor is further configured to produce a residual image, and identify defects in the second component.
    Type: Application
    Filed: April 10, 2020
    Publication date: October 14, 2021
    Inventors: Alberto Santamaria-Pang, Yousef Al-Kofahi, Aritra Chowdhury, Shourya Sarcar, Michael John MacDonald, Peter Arjan Wassenaar, Patrick Joseph Howard, Bruce Courtney Amm, Eric Seth Moderbacher