Abstract: A method includes obtaining multiple data items from multiple heterogeneous data sources, where the multiple data items relate to an unmanned aerial system (UAS) flying in an area. The method also includes processing the multiple data items using a machine learning algorithm to determine a threat level of the UAS to one or more targets in the area. The method further includes outputting the threat level of the UAS for review by a user.

Abstract: Disclosed herein are Raman spectrographic systems and methods of assembling Raman spectrographic systems. The Raman spectrographic system includes a light source to emit ultraviolet incident light into a waveguide, and an interaction region traversed by the waveguide and that holds a sample to be identified. A spectrometer detects Raman scatter from an output light in the waveguide emerging from the interaction region following interaction between the incident light and the sample and output a spectral response. The spectrometer includes an array of detectors. Each detector of the array of detectors is a silicon carbide (SiC) detector to obtain information that includes an intensity corresponding with a wavelength of the Raman scatter. A controller identifies the sample based on the spectral response from the array of detectors.

Abstract: A method includes obtaining multiple data items from multiple heterogeneous data sources, where the multiple data items relate to an unmanned aerial system (UAS) flying in an area. The method also includes processing the multiple data items using a machine learning algorithm to determine a threat level of the UAS to one or more targets in the area. The method further includes outputting the threat level of the UAS for review by a user.

Abstract: A detector apparatus is provided and includes a collector having access to a sample of a gaseous fluid and a tester coupled to and disposed remotely from the collector. The tester includes a test chamber into which a sample is directed from the collector, an excitation element to excite the sample in the test chamber and a spectrum analyzing device coupled to the test chamber to analyze the excited sample for evidence of a concentration of particles of interest in the gaseous fluid exceeding a threshold concentration. The threshold concentration is defined in accordance with a type of the particles of interest and a residence time of the sample.

Abstract: A detector apparatus is provided and includes a collector having access to a sample of a gaseous fluid and a tester coupled to and disposed remotely from the collector. The tester includes a test chamber into which a sample is directed from the collector, an excitation element to excite the sample in the test chamber and a spectrum analyzing device coupled to the test chamber to analyze the excited sample for evidence of a concentration of particles of interest in the gaseous fluid exceeding a threshold concentration. The threshold concentration is defined in accordance with a type of the particles of interest and a residence time of the sample.

Abstract: Methods and apparatus for a detector system to detect gamma and neutron radiation. In one embodiment, a detector comprises a tank to hold a liquid, a plurality of tubes adjacent the tank to detect neutrons, and a plurality of photon detectors to detect Cherenkov light generated by gamma radiation in the liquid. The tank is configured to contain the liquid so that the liquid generates the Cherenkov light and moderates the neutrons.

Abstract: Methods and apparatus for a detector system to detect gamma and neutron radiation. In one embodiment, a detector comprises a tank to hold a liquid, a plurality of tubes adjacent the tank to detect neutrons, and a plurality of photon detectors to detect Cherenkov light generated by gamma radiation in the liquid. The tank is configured to contain the liquid so that the liquid generates the Cherenkov light and moderates the neutrons.

Abstract: An X-ray source such as a synchrotron which provides a significant spectral content of hard X-rays is used to expose relatively thick photoresist such that the portions of the photoresist at an exit surface receive at least a threshold dose sufficient to render the photoresist susceptible to a developer, while the entrance surface of the photoresist receives an exposure which does not exceed a power limit at which destructive disruption of the photoresist would occur. The X-ray beam is spectrally shaped to substantially eliminate lower energy photons while allowing a substantial flux of higher energy photons to pass through to the photoresist target. Filters and the substrate of the X-ray mask may be used to spectrally shape the X-ray beam. Machining of photoresists such as polymethylmethacrylate to micron tolerances may be obtained to depths of several centimeters, and multiple targets may be exposed simultaneously.