Patents by Inventor Erik Laegsgaard

Erik Laegsgaard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Metal tip for scanning probe applications and method of producing the same
    Patent number: 8661561
    Abstract: A metal tip (1) for scanning probe applications is provided. The tip (1) has an axial extension (I), a radial extension (d), a pointy section (B) that extends axially from a section of maximum radial extension (5) to an atomically sharp end (9), and a blunt section (A) that extends axially from the section of maximum radial extension (5) to a blunt end (7), where the axial extension of the pointy section (B) is larger than the axial extension of the blunt section (A) The metal tip (1) has a mass of 10 ?g or less.
    Type: Grant
    Filed: August 2, 2010
    Date of Patent: February 25, 2014
    Assignee: SPECS Surface Nano Analysis GmbH
    Inventor: Erik Laegsgaard
  • METAL TIP FOR SCANNING PROBE APPLICATIONS AND METHOD OF PRODUCING THE SAME
    Publication number: 20120174269
    Abstract: A metal tip (1) for scanning probe applications is provided. The tip (1) has an axial extension (I), a radial extension (d), a pointy section (B) that extends axially from a section of maximum radial extension (5) to an atomically sharp end (9), and a blunt section (A) that extends axially from the section of maximum radial extension (5) to a blunt end (7), where the axial extension of the pointy section (B) is larger than the axial extension of the blunt section (A) The metal tip (1) has a mass of 10 ?g or less.
    Type: Application
    Filed: August 2, 2010
    Publication date: July 5, 2012
    Applicant: SPECS SURFACE NANO ANALYSIS GMBH
    Inventor: Erik Laegsgaard