Abstract: A method is provided for inspecting a device comprising a plurality of bristles. During this method, image data provided from an electronic optical sensor is received. The image data is indicative of an image of at least a portion of the bristles. A bristle configuration (e.g., an angle) of at least one of the bristles (e.g., an average bristle) in the image is determined by processing the image data with a computer processor.

Abstract: A method is provided for inspecting a device comprising a plurality of bristles. During this method, image data provided from an electronic optical sensor is received. The image data is indicative of an image of at least a portion of the bristles. A bristle configuration (e.g., an angle) of at least one of the bristles (e.g.

Abstract: An optical height gauge including a housing, a mounting bar coupled to, and maintained partially in, the housing, a mounting bracket connected to the mounting bar, the mounting bracket including at least one light source holder, a camera mount connected to the mounting bracket, and a tilt bar connected to the mounting bracket and contacting the mounting bar.

Abstract: An optical height gauge including a housing, a mounting bar coupled to, and maintained partially in, the housing, a mounting bracket connected to the mounting bar, the mounting bracket including at least one light source holder, a camera mount connected to the mounting bracket, and a tilt bar connected to the mounting bracket and contacting the mounting bar.

Abstract: Inspecting features of an object including measuring features of the master part that represents a desired nominal dimensions to obtain a preliminary set of dimensional data. The preliminary set of data becomes a master data set. The same master part is measured on a second machine to obtain another set of data on the master part. The two data sets are compared and correction data is generated representing differences between the different data sets for the same master part measured on different machines. Subsequent parts are then measured on the second machine to obtain measurement data that is corrected based on the correction data. The application of the correction information provides for the use of 5-axis machines within a desired measurement capability.

Abstract: A laser alignment system may comprise a machine, a laser source attached to the machine, a photodiode able to communicate with the laser source, and a receiver including the photodiode, wherein a signal is generated upon communication between the photodiode and the laser source.

Abstract: A laser alignment system may comprise a machine, a laser source attached to the machine, a photodiode able to communicate with the laser source, and a receiver including the photodiode, wherein a signal is generated upon communication between the photodiode and the laser source.

Abstract: A calibration artifact for an inspection system is provided. The calibration artifact comprises a base adapted for placement within a holding fixture of an inspection system during calibration, a sphere operatively connected to the base, and a light source operatively connected to the base. The base, the sphere, and the light source are removable from the inspection system after calibration.

Abstract: A deformable label processor and related methods are described. The processor is heated and urged against a label, such as a heat transfer label, to apply one or more designs from the label and/or the label itself onto a container or other surface. The processor and methods are well suited for application of labels onto compound curved surfaces. The label processors include particular exhaust assemblies and air diffuser assemblies.

Abstract: A method and system are provided for inspecting a plurality of target features arrayed in spaced arrangement on a surface of a target object, such as but not limited to inspection of the location of cooling air holes in the surface of a turbine blade or vane.

Abstract: A deformable label processor and related methods are described. The processor is heated and urged against a label, such as a heat transfer label, to apply one or more designs from the label and/or the label itself onto a container or other surface. The processor and methods are well suited for application of labels onto compound curved surfaces. The label processors include particular exhaust assemblies and air diffuser assemblies.

Abstract: A calibration artifact for an inspection system is provided. The calibration artifact comprises a base adapted for placement within a holding fixture of an inspection system during calibration, a sphere operatively connected to the base, and a light source operatively connected to the base. The base, the sphere, and the light source are removable from the inspection system after calibration.

Abstract: A method and system are provided for inspecting a plurality of target features arrayed in spaced arrangement on a surface of a target object, such as but not limited to inspection of the location of cooling air holes in the surface of a turbine blade or vane.