Abstract: The present document relates to a method of calibrating, in a scanning probe microscopy system, an optical microscope. The optical microscope is configured for providing a reference data for positioning a probe tip on a surface of a substrate. The calibration is performed using a calibration structure being a spatial structure including features at different Z-levels relative to a Z-axis, the Z-axis being perpendicular to the surface of the substrate. The method comprises a step of obtaining, with the optical microscope, at least two images of at least a part of the calibration structure. The at least two images are focused in at least two different levels of the Z-levels. The method further comprises a step of determining a lateral shift, in a direction perpendicular to the Z-axis, of the calibration structure as depicted in the at least two images focused in the at least two different levels.

Abstract: An alignment system and method for aligning an object (O) having an object marker. An image of the object marker is projected onto an imaging sensor (11) having sensor elements. At least one reference marker is projected onto the imaging sensor (11). Based on image output (111) from the imaging sensor (11), respective subsets of sensor elements are determined. Based on a first subset of the sensor elements, a marker position is determined where the image of the object marker is projected onto the imaging sensor (11). Based on a second subset (Sr) of the sensor elements, a reference position is determined where the reference marker is projected onto the imaging sensor (11). The marker position correlates with a position (Xm,Ym) of the object (O) whereas the reference position does not. The object position (Xm,Ym) is determined based on the marker position relative to the reference position.

Abstract: The invention relates to an instrument, preferably for minimally invasive surgery, comprising a frame (27) having a proximal end and a distal end, a first working element (4) having a first origin located at the distal end and a second working element (5) having a second origin and being arranged at the distal end cooperating with the first working element, a force sensor for measuring a force exerted on at least one of the said the first and the second working elements, wherein the distal end of the frame comprises an opening (23) between the first origin and the second origin, the force sensor being arranged on the frame in a vicinity of the opening.

Abstract: The invention relates to an instrument, preferably for minimally invasive surgery, comprising a frame (27) having a proximal end and a distal end, a first working element (4) having a first origin located at the distal end and a second working element (5) having a second origin and being arranged at the distal end cooperating with the first working element, a force sensor for measuring a force exerted on at least one of the said the first and the second working elements, wherein the distal end of the frame comprises an opening (23) between the first origin and the second origin, the force sensor being arranged on the frame in a vicinity of the opening.