Patents by Inventor Erikki Puusaari

Erikki Puusaari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7508906
    Abstract: An X-ray fluorescence measurement device comprises an X-ray source and a sample window for allowing X-rays from the X-ray source reach a sample. A filter arrangement between the X-ray source and the sample window includes a first filter layer comprising a first filtering element and a second filter layer including a second filtering element. The atomic number of the second filtering element is greater than the atomic number of the first filtering element. The first filter layer is between the X-ray source and the second filter layer.
    Type: Grant
    Filed: April 26, 2007
    Date of Patent: March 24, 2009
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Erikki Puusaari, Andy Ellis
  • Publication number: 20080267348
    Abstract: An X-ray fluorescence measurement device comprises an X-ray source and a sample window for allowing X-rays from said X-ray source reach a sample. A filter arrangement between said X-ray source and said sample window comprises a first filter layer comprising a first filtering element and a second filter layer comprising a second filtering element. The atomic number of the second filtering element is greater than the atomic number of the first filtering element. Said first filter layer is between said X-ray source and said second filter layer.
    Type: Application
    Filed: April 26, 2007
    Publication date: October 30, 2008
    Inventors: Erikki Puusaari, Andy Ellis