Abstract: A planar contact set for use in a test fixture for receiving an integrated circuit package for facilitating the electrical connection thereof to test equipment so that electrical and electronic tests can be performed on the integrated circuit. The contact set includes a flexible insulating support member having a central aperture which supports a plurality of conductive contact strips which extend over the aperture in cantilever fashion. The support member includes a support sheet underlying the contact strips and a retaining sheet overlying the contact strips, the sheets maintaining the strips in the proper position to contact the leads of the integrated circuit package when in a test registration position and also to enable electrical connections to be made to the test apparatus.