Patents by Inventor Ernest Y. Yu

Ernest Y. Yu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Correction for stress induced leakage current in dielectric reliability evaluations
    Patent number: 8937487
    Abstract: Methods, apparatus, and computer program products for evaluating current transients measured during an electrical stress evaluation of a dielectric layer in a semiconductor device. Measured current transients are fit to an equation representing a time dependence for stress induced leakage currents. The measured current transients are corrected based upon stress currents computed from the equation to define corrected current transients.
    Type: Grant
    Filed: May 27, 2011
    Date of Patent: January 20, 2015
    Assignee: International Business Machines Corporation
    Inventors: Steven W. Mittl, Ernest Y. Yu