Patents by Inventor Errol P. Akomer

Errol P. Akomer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7855088
    Abstract: The invention provides a method for manufacturing an integrated circuit. The method, in one embodiment, includes inspecting a semiconductor wafer including a plurality of die for a defect, the inspecting providing an image of the semiconductor wafer including the defect. The method further includes identifying an area of the semiconductor wafer from the image, wherein the identified area encompasses at least those die including any portion of the defect, and dicing the semiconductor wafer into individual die. The die defined by the identified area, in this embodiment, are then discarded.
    Type: Grant
    Filed: December 21, 2006
    Date of Patent: December 21, 2010
    Assignee: Texas Instruments Incorporated
    Inventors: Errol P. Akomer, James Bright, Mohammad Nikpour, Jason Tervooren, Kyle Flessner
  • Publication number: 20080153184
    Abstract: The invention provides a method for manufacturing an integrated circuit. The method, in one embodiment, includes inspecting a semiconductor wafer including a plurality of die for a defect, the inspecting providing an image of the semiconductor wafer including the defect. The method further includes identifying an area of the semiconductor wafer from the image, wherein the identified area encompasses at least those die including any portion of the defect, and dicing the semiconductor wafer into individual die. The die defined by the identified area, in this embodiment, are then discarded.
    Type: Application
    Filed: December 21, 2006
    Publication date: June 26, 2008
    Applicant: Texas Instruments Incorporated
    Inventors: Errol P. Akomer, James Bright, Mohammad Nikpour, Jason Tervooren, Kyle Flessner