Patents by Inventor Erwei MA

Erwei MA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for evaluating brightness measurement accuracy of Demura equipment
    Patent number: 11081029
    Abstract: The invention discloses a method for evaluating a brightness measurement accuracy of a Demura equipment by generating a noise-added image by adding a random number to an original grayscale image and obtaining a measurement value corresponding to the added random number via the noise-added image displayed by the Demura equipment. The brightness measurement accuracy of the Demura equipment is evaluated based on a correlation between the measured value and the originally added random number to measure a brightness extraction performance of the Demura equipment. The method provided by the invention provides a quantitative and measurable determining method that may better reflect the actual performance of the Demura equipment.
    Type: Grant
    Filed: July 9, 2018
    Date of Patent: August 3, 2021
    Assignee: WUHAN JINGCE ELECTRONIC GROUP CO., LTD.
    Inventors: Xiaofan Feng, Zengqiang Zheng, Zhao Liu, Erwei Ma, Hongjun Wu, Ronghua Liu, Yafei Shen
  • METHOD FOR EVALUATING BRIGHTNESS MEASUREMENT ACCURACY OF DEMURA EQUIPMENT
    Publication number: 20200380897
    Abstract: The invention discloses a method for evaluating a brightness measurement accuracy of a Demura equipment by generating a noise-added image by adding a random number to an original grayscale image and obtaining a measurement value corresponding to the added random number via the noise-added image displayed by the Demura equipment. The brightness measurement accuracy of the Demura equipment is evaluated based on a correlation between the measured value and the originally added random number to measure a brightness extraction performance of the Demura equipment. The method provided by the invention provides a quantitative and measurable determining method that may better reflect the actual performance of the Demura equipment.
    Type: Application
    Filed: July 9, 2018
    Publication date: December 3, 2020
    Applicant: WUHAN JINGCE ELECTRONIC GROUP CO., LTD.
    Inventors: Xiaofan FENG, Zengqiang ZHENG, Zhao LIU, Erwei MA, Hongjun WU, Ronghua LIU, Yafei SHEN