Patents by Inventor Esdras Cruz-Aguilar

Esdras Cruz-Aguilar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11204820
    Abstract: Examples of techniques for failure detection for central electronics complex (CEC) group management are described herein. An aspect includes issuing a first virtual input/output server (VIOS) probe to a hardware management console (HMC) of a central electronics complex (CEC) group. Another aspect includes receiving a first response packet that includes health data corresponding to a plurality of VIOSes. Another aspect includes determining, based on the first response packet, that cluster down is indicated on a first VIOS. Another aspect includes, based on determining that cluster down is indicated on the first VIOS, getting a VIOS state for the first VIOS from the HMC. Another aspect includes determining based on the VIOS state that the first VIOS is in a down state and determining that the first VIOS is unhealthy. Another aspect includes updating a health data entry corresponding to the first VIOS to indicate that the first VIOS is unhealthy.
    Type: Grant
    Filed: April 27, 2020
    Date of Patent: December 21, 2021
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Perinkulam I. Ganesh, Ravi Shankar, Esdras Cruz-Aguilar, Jes Kiran Chittigala, Michael Burton, Corradino Jones, Denise Marie Genty, James Pafumi
  • Publication number: 20200257599
    Abstract: Examples of techniques for failure detection for central electronics complex (CEC) group management are described herein. An aspect includes issuing a first virtual input/output server (VIOS) probe to a hardware management console (HMC) of a central electronics complex (CEC) group. Another aspect includes receiving a first response packet that includes health data corresponding to a plurality of VIOSes. Another aspect includes determining, based on the first response packet, that cluster down is indicated on a first VIOS. Another aspect includes, based on determining that cluster down is indicated on the first VIOS, getting a VIOS state for the first VIOS from the HMC. Another aspect includes determining based on the VIOS state that the first VIOS is in a down state and determining that the first VIOS is unhealthy. Another aspect includes updating a health data entry corresponding to the first VIOS to indicate that the first VIOS is unhealthy.
    Type: Application
    Filed: April 27, 2020
    Publication date: August 13, 2020
    Inventors: Perinkulam I. Ganesh, Ravi Shankar, Esdras Cruz-Aguilar, Jes Kiran Chittigala, Michael Burton, Corradino Jones, Denise Marie Genty, James Pafumi
  • Patent number: 10713138
    Abstract: Examples of techniques for failure detection for central electronics complex (CEC) group management are described herein. An aspect includes issuing a first logical partition (LPAR) probe to a hardware management console (HMC) of a central electronics complex (CEC) group, wherein the CEC group comprises a plurality of LPARs. Another aspect includes receiving a first response packet from the HMC corresponding to the first LPAR probe, wherein the first response packet comprises health data corresponding to a first LPAR of the plurality of LPARs. Another aspect includes storing the health data corresponding to the first LPAR in a first health data entry corresponding to the first LPAR. Another aspect includes, for a second LPAR of the plurality of LPARs that was not included in the first response packet, updating a second health data entry corresponding to the second LPAR to indicate that the second LPAR is healthy.
    Type: Grant
    Filed: November 8, 2018
    Date of Patent: July 14, 2020
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Perinkulam I. Ganesh, Ravi Shankar, Esdras Cruz-Aguilar, Jes Kiran Chittigala, Michael Burton, Corradino Jones, Denise Marie Genty, James Pafumi
  • Publication number: 20200151069
    Abstract: Examples of techniques for failure detection for central electronics complex (CEC) group management are described herein. An aspect includes issuing a first logical partition (LPAR) probe to a hardware management console (HMC) of a central electronics complex (CEC) group, wherein the CEC group comprises a plurality of LPARs. Another aspect includes receiving a first response packet from the HMC corresponding to the first LPAR probe, wherein the first response packet comprises health data corresponding to a first LPAR of the plurality of LPARs. Another aspect includes storing the health data corresponding to the first LPAR in a first health data entry corresponding to the first LPAR. Another aspect includes, for a second LPAR of the plurality of LPARs that was not included in the first response packet, updating a second health data entry corresponding to the second LPAR to indicate that the second LPAR is healthy.
    Type: Application
    Filed: November 8, 2018
    Publication date: May 14, 2020
    Inventors: Perinkulam I. Ganesh, Ravi Shankar, Esdras Cruz-Aguilar, Jes Kiran Chittigala, Michael Burton, Corradino Jones, Denise Marie Genty, James Pafumi