Patents by Inventor Esha SenGupta

Esha SenGupta has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for detecting defects in a component
    Patent number: 10152784
    Abstract: A method for inspecting a component is presented. The method includes inducing, by an inductive coil, an electrical current flow into the component. Further, the method includes capturing, by an infrared (IR) camera, at least a first set of frames and a second set of frames corresponding to the component, wherein the first set of frames is captured at a first time interval and a second set of frames is captured at a second time interval. Also, the method includes constructing, by a processing unit, a thermal image based on at least the first set of frames and the second set of frames corresponding to the component. Furthermore, the method includes determining presence of a thermal signature in the thermal image, wherein the thermal signature is representative of a defect in the component.
    Type: Grant
    Filed: June 30, 2016
    Date of Patent: December 11, 2018
    Assignee: GENERAL ELECTRIC COMPANY
    Inventors: Venkata Vijayaraghava Nalladega, Thomas James Batzinger, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, Bryon Edward Knight, Satheesh Jeyaraman, Esha SenGupta
  • SYSTEM AND METHOD FOR DETECTING DEFECTS IN A COMPONENT
    Publication number: 20180005368
    Abstract: A method for inspecting a component is presented. The method includes inducing, by an inductive coil, an electrical current flow into the component. Further, the method includes capturing, by an infrared (IR) camera, at least a first set of frames and a second set of frames corresponding to the component, wherein the first set of frames is captured at a first time interval and a second set of frames is captured at a second time interval. Also, the method includes constructing, by a processing unit, a thermal image based on at least the first set of frames and the second set of frames corresponding to the component. Furthermore, the method includes determining presence of a thermal signature in the thermal image, wherein the thermal signature is representative of a defect in the component.
    Type: Application
    Filed: June 30, 2016
    Publication date: January 4, 2018
    Inventors: Venkata Vijayaraghava Nalladega, Thomas James Batzinger, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, Bryon Edward Knight, Satheesh Jeyaraman, Esha SenGupta