Patents by Inventor Ethan James Shepherd

Ethan James Shepherd has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230408252
    Abstract: A multi-axis system (30) for positioning a workpiece measuring sensor (54) on a metrology machine. Preferably, each sensor is positionable via a system comprising movement along and/or about at least linear directions/axes (X, Z, A, B) so as to control linear and/or rotational movement of a sensor automatically to a predetermined position without operator intervention. The multi-axis positioning system allows faster setup times when a workpiece or tooling on a machine is changed.
    Type: Application
    Filed: November 16, 2021
    Publication date: December 21, 2023
    Inventors: Parag Prakash Wagaj, Ethan James Shepherd, Michael R. Tanner, Edward J. Damron, Douglas Charles Beerck
  • Patent number: 11754387
    Abstract: A probe calibration method and calibration artifact (30, 70) whereby calibration can be performed without the use of machine axes capable of three dimensional positioning of a probe relative to a calibration sphere (40). The method includes a plurality of calibration spheres fixed in relation to one another via a rigid structure comprising a calibration artifact body (30, 70). The spheres are mounted such that each will be sensed by the probe at some position of a machine axis (W, N). In other words, the spheres lie in the region swept out by the sensor field of view (8, 78) over the movement of the machine axis. The calibration spheres are located at known positions (A, B, C) and the calibration artifact body is designed such that it may be mounted in a known location in place of a work piece.
    Type: Grant
    Filed: March 6, 2020
    Date of Patent: September 12, 2023
    Assignee: GLEASON METROLOGY SYSTEMS CORPORATION
    Inventors: Ethan James Shepherd, Parag P. Wagaj
  • Publication number: 20220074732
    Abstract: A probe calibration method and calibration artifact (30, 70) whereby calibration can be performed without the use of machine axes capable of three dimensional positioning of a probe relative to a calibration sphere (40). The method includes a plurality of calibration spheres fixed in relation to one another via a rigid structure comprising a calibration artifact body (30, 70). The spheres are mounted such that each will be sensed by the probe at some position of a machine axis (W, N). In other words, the spheres lie in the region swept out by the sensor field of view (8, 78) over the movement of the machine axis. The calibration spheres are located at known positions (A, B, C) and the calibration artifact body is designed such that it may be mounted in a known location in place of a work piece.
    Type: Application
    Filed: March 6, 2020
    Publication date: March 10, 2022
    Inventors: Ethan James Shepherd, Parag P. Wagaj
  • Patent number: 11262190
    Abstract: A method and machine comprising at least one non-contact sensor (52) on a functional testing platform (50) for workpiece inspection and/or measurement. The inclusion of at least one non-contact sensor on the functional testing platform results in the combination of two machine platforms into a single machine and provides the user with measurement characteristics of both methods, functional and analytical, saving significant cycle time and significant space.
    Type: Grant
    Filed: October 23, 2018
    Date of Patent: March 1, 2022
    Assignee: GLEASON METROLOGY SYSTEMS CORPORATION
    Inventors: Parag Prakash Wagaj, Douglas Charles Beerck, Ethan James Shepherd, Michael R. Tanner, Edward J. Damron, Aaron Timothy Slusser
  • Patent number: 11092430
    Abstract: A method and machine whereby utilizing both tactile (46) and non-contact (50) sensors or probes for workpiece (56) inspection and/or measurement results in significant cycle time savings while accuracy is maintained.
    Type: Grant
    Filed: September 6, 2017
    Date of Patent: August 17, 2021
    Assignee: GLEASON METROLOGY SYSTEMS CORPORATION
    Inventors: Parag P. Wagaj, Ethan James Shepherd, Michael Tanner, Justin Shultz, Ronald E. Mack, Douglas Charles Beerck
  • Publication number: 20200292305
    Abstract: A method and machine comprising at least one non-contact sensor (52) on a functional testing platform (50) for workpiece inspection and/or measurement. The inclusion of at least one non-contact sensor on the functional testing platform results in the combination of two machine platforms into a single machine and provides the user with measurement characteristics of both methods, functional and analytical, saving significant cycle time and significant space.
    Type: Application
    Filed: October 23, 2018
    Publication date: September 17, 2020
    Inventors: Parag Prakash Wagaj, Douglas Charles Beerck, Ethan James Shepherd, Michael R. Tanner, Edward J. Damron, Aaron Timothy Slusser
  • Publication number: 20190249983
    Abstract: A method and machine whereby utilizing both tactile (46) and non-contact (50) sensors or probes for workpiece (56) inspection and/or measurement results in significant cycle time savings while accuracy is maintained.
    Type: Application
    Filed: September 6, 2017
    Publication date: August 15, 2019
    Inventors: Parag P. Wagaj, Ethan James Shepherd, Michael Tanner, Justin Shultz, Ronald E. Mack, Douglas Charles Beerck