Abstract: A semiconductor on insulator type substrate, comprising at least: a support layer; a semiconductor surface layer; a buried dielectric layer located between the support layer and the semiconductor surface layer; a trap rich layer located between the buried dielectric layer and the support layer, and comprising at least one polycrystalline semiconductor material and/or a phase change material; in which the trap rich layer comprises at least one first region and at least one second region adjacent to each other in the plane of the trap rich layer, the material of the at least one first region being in an at least partially recrystallized state and having an electrical resistivity less than that of the material in the at least one second region.

Abstract: A semiconductor on insulator type substrate, comprising at least: a support layer; a semiconductor surface layer; a buried dielectric layer located between the support layer and the semiconductor surface layer; a trap rich layer located between the buried dielectric layer and the support layer, and comprising at least one polycrystalline semiconductor material and/or a phase change material; in which the trap rich layer comprises at least one first region and at least one second region adjacent to each other in the plane of the trap rich layer, the material of the at least one first region being in an at least partially recrystallized state and having an electrical resistivity less than that of the material in the at least one second region.

Abstract: A semiconductor on insulator type substrate, comprising at least: a support layer; a semiconductor surface layer; a buried dielectric layer located between the support layer and the semiconductor surface layer; a trap rich layer located between the buried dielectric layer and the support layer, and comprising at least one polycrystalline semiconductor material and/or a phase change material; in which the trap rich layer comprises at least one first region and at least one second region adjacent to each other in the plane of the trap rich layer, the material of the at least one first region being in an at least partially recrystallized state and having an electrical resistivity less than that of the material in the at least one second region.

Abstract: This process comprises steps of: a) providing a first substrate comprising the active layer made of a first material of Young's modulus E1 and of thickness h1; b) providing a second substrate made of a second material of Young's modulus E2 and of thickness h2; c) bending the first substrate and the second substrate such that they each have a curved shape of a radius of curvature R; d) joining the second substrate to the active layer such that the second substrate closely follows the shape of the first substrate; and e) re-establishing the initial at-rest shape of the second substrate, the process being noteworthy in that the second material of the second substrate is a flexible material respecting the relationship E2/E1<10?2, in that the thickness of the second substrate respects the relationship h2/h1?104, and in that the radius of curvature respects the relationship R = h 2 2 ? ? ? .

Abstract: This process comprises steps of: a) providing a first substrate comprising the active layer made of a first material of Young's modulus E1 and of thickness h1; b) providing a second substrate made of a second material of Young's modulus E2 and of thickness h2; c) bending the first substrate and the second substrate such that they each have a curved shape of a radius of curvature R; d) joining the second substrate to the active layer such that the second substrate closely follows the shape of the first substrate; and e) re-establishing the initial at-rest shape of the second substrate, the process being noteworthy in that the second material of the second substrate is a flexible material respecting the relationship E2/E1<10?2, in that the thickness of the second substrate respects the relationship h2/h1?104, and in that the radius of curvature respects the relationship R = h 2 2 ? ? ? .