Patents by Inventor Etsuo Arakawa

Etsuo Arakawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9714907
    Abstract: It is an object of the present invention to provide a method and an apparatus for measuring a scattering intensity distribution capable of measuring a scattering intensity distribution in a reciprocal space in a short time.
    Type: Grant
    Filed: December 10, 2013
    Date of Patent: July 25, 2017
    Assignee: Inter-University Research Institute Corporation High Energy Accelerator Research Organization
    Inventors: Tadashi Matsushita, Wolfgang Voegeli, Tetsuro Shirasawa, Toshio Takahashi, Etsuo Arakawa
  • Publication number: 20160069825
    Abstract: It is an object of the present invention to provide a method and an apparatus for measuring a scattering intensity distribution capable of measuring a scattering intensity distribution in a reciprocal space in a short time.
    Type: Application
    Filed: December 10, 2013
    Publication date: March 10, 2016
    Applicant: Inter-University Research Institute Corporation High Energy Accelerator Research Organization
    Inventors: Tadashi Matsushita, Wolfgang Voegeli, Tetsuro Shirasawa, Toshio Takahashi, Etsuo Arakawa
  • Patent number: 8036338
    Abstract: Since measurement of magnetostriction is accompanied by measurement of magnetization, magnetostriction and magnetization are measured conventionally by separately prepared devices, with efforts for observing the same region of the sample. Measurement of the magnetostriction is difficult due to the difficulty of compensation and calibration. The value of magnetostriction coefficient in low temperature region cannot be correctly determined. A convenient method which can measure magnetostriction and magnetization simultaneously at the same region of the sample and at the same time is developed by combining the method of measurement of magnetostriction by X-ray diffraction and the method of measurement of magnetic X-ray diffraction. The observed X-ray diffraction intensity as a function of the magnetic field from the sample can be separated to symmetric component and asymmetric component, which contain signals proportional to the magnetostriction and magnetization, respectively.
    Type: Grant
    Filed: November 24, 2005
    Date of Patent: October 11, 2011
    Assignees: Tokyo Gakugei University, National Institutes of Natural Sciences
    Inventors: Etsuo Arakawa, Noriyuki Aizawa, Koichi Maruyama
  • Publication number: 20100013469
    Abstract: Since a measurement of a magnetostriction is accompanied by a measurement of a magnetization of a sample to be measured, the magnetostriction and the magnetization are measured by separately prepared devices, with efforts for observing the coextensive volumes of the sample. Measurements of the magnetostriction and the magnetization are difficult due to the difficulty of correction and calibration. The value of macroscopic external mode magnetostrictive coefficient cannot be correctly determined at low temperature regions. A convenient method which enables the measurement of the magnetostriction and the magnetization simultaneously at the coextensive volumes of the sample, is developed by combining the method of the measurement of the magnetostriction by an X-ray diffraction method an the method of the X-ray magnetic diffraction method.
    Type: Application
    Filed: November 24, 2005
    Publication date: January 21, 2010
    Applicants: TOKYO GAKUGEI UNIVERSITY, NATIONAL INSTITUTES OF NATURAL SCIENCES
    Inventors: Etsuo Arakawa, Noriyuki Aizawa, Koichi Maruyama