Abstract: A pulse generation circuit delivers an output pulse whose width is tailored to the load. The pulse generation circuit comprises the following components. A drive circuit has an input coupled to receive a clock signal and an output coupled to drive a load. A comparator has an input coupled to the output of the drive circuit. Another input of the comparator is supplied by a reference voltage. A feedback circuit comprises logic gates and is coupled between the output of the comparator and the input of the drive circuit. The feedback circuit terminates a pulse output from the drive circuit when the pulse voltage output from the drive circuit exceeds the reference voltage. The reference voltage is higher than a voltage required to trigger the logic gates and a voltage required to drive the load. This ensures that the load is driven adequately over a wide range of load currents and capacitances.

Abstract: A pulse generation circuit delivers an output pulse whose width is tailored to the load. The pulse generation circuit comprises the following components. A drive circuit has an input coupled to receive a clock signal and an output coupled to drive a load. A comparator has an input coupled to the output of the drive circuit. Another input of the comparator is supplied by a reference voltage. A feedback circuit comprises logic gates and is coupled between the output of the comparator and the input of the drive circuit. The feedback circuit terminates a pulse output from the drive circuit when the pulse voltage output from the drive circuit exceeds the reference voltage. The reference voltage is higher than a voltage required to trigger the logic gates and a voltage required to drive the load. This ensures that the load is driven adequately over a wide range of load currents and capacitances.

Abstract: An improved polarity hold latch is described having a set and reset capability integrated therein. As implemented, this latch provides the desired logical functions at a reduced circuit cost and power requirements. At the same time, it overcomes the need to test for and resolve potential signal race conditions. The improved latch is particularly susceptible of being implemented on a single chip.

Abstract: Apparatus for assembling binary data bits in parallel by groups in variable, selected locations in a shift register for subsequent serial readout. One or more shift registers are arranged in a matrix of rows and columns of storage cells and addressed along one coordinate while a plurality of data are applied in parallel along the orthogonal. Selector circuits are controlled to selectively shift a data word to enable the first bit in the word to be stored in any storage position within the addressed coordinate, with each remaining bit in the word stored in a correspondingly contiguous storage position in the matrix. Bit storage cells of the shift registers are of the set-reset latch type so that once set they cannot be changed by subsequent data bits until the entire array is reset. This enables the overwriting of successive data bytes.