Abstract: Electrical contact probes for use in providing electrical contact between diagnostic equipment and an electrical device to be tested are provided. The probes disclosed herein are particularly suitable for use where contact sites are spaced relatively close together. A structure is disclosed, usable for a plurality of probe designs, including two-component and three-component contact probes, which enables the probes to be mounted by a variety of methods. Generally, the methods of mounting disclosed are enabled by the positioning of a mounting flare on the contact probes. Also shown is a three-component contact probe design that is particularly suited for use in long stroke applications, wherein the contact probe generally comprises an outer cylinder member, an internally received barrel, and a movable probe member. This latter member includes a relatively narrow shaft portion which slidably engages the barrel member, within the cylinder member.