Patents by Inventor Eugene Reuvekamp

Eugene Reuvekamp has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High resolution X-ray diffraction method and apparatus
    Patent number: 10753890
    Abstract: An X-ray diffraction apparatus for high resolution measurement combines the use of an X-ray source with a target having an atomic number Z less 50 with an energy resolving X-ray detector having an array of pixels and a beta radiation multilayer mirror for selecting the K-beta radiation from the X-ray source and for reflecting the K-beta radiation onto the sample where it is diffracted onto the energy resolving X-ray detector. The sample may in particular be in transmission. The sample may be a powder sample in a capillary.
    Type: Grant
    Filed: March 6, 2018
    Date of Patent: August 25, 2020
    Assignee: MALVERN PANALYTICAL B.V.
    Inventors: Detlef Beckers, Alexander Kharchenko, Milen Gateshki, Eugene Reuvekamp
  • High resolution X-ray Diffraction Method and Apparatus
    Publication number: 20180259464
    Abstract: An X-ray diffraction apparatus for high resolution measurement combines the use of an X-ray source with a target having an atomic number Z less 50 with an energy resolving X-ray detector having an array of pixels and a beta radiation multilayer mirror for selecting the K-beta radiation from the X-ray source and for reflecting the K-beta radiation onto the sample where it is diffracted onto the energy resolving X-ray detector. The sample may in particular be in transmission. The sample may be a powder sample in a capillary.
    Type: Application
    Filed: March 6, 2018
    Publication date: September 13, 2018
    Inventors: Detlef Beckers, Alexander Kharchenko, Milen Gateshki, Eugene Reuvekamp