Patents by Inventor Euichul Hwang
Euichul Hwang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12272606Abstract: A semiconductor device is provided. The semiconductor device includes a substrate including an active pattern, a gate electrode extending in a first direction and crossing the active pattern which extends in a second direction, a separation structure crossing the active pattern and extending in the first direction, a first gate dielectric pattern disposed on a side surface of the gate electrode, a second gate dielectric pattern disposed on a side surface of the separation structure, and a gate capping pattern covering a top surface of the gate electrode. A level of a top surface of the separation structure is higher than a level of a top surface of the gate capping pattern.Type: GrantFiled: April 14, 2023Date of Patent: April 8, 2025Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Sangmin Yoo, Juyoun Kim, Hyungjoo Na, Bongseok Suh, Jooho Jung, Euichul Hwang, Sungmoon Lee
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Publication number: 20230253264Abstract: A semiconductor device is provided. The semiconductor device includes a substrate including an active pattern, a gate electrode extending in a first direction and crossing the active pattern which extends in a second direction, a separation structure crossing the active pattern and extending in the first direction, a first gate dielectric pattern disposed on a side surface of the gate electrode, a second gate dielectric pattern disposed on a side surface of the separation structure, and a gate capping pattern covering a top surface of the gate electrode. A level of a top surface of the separation structure is higher than a level of a top surface of the gate capping pattern.Type: ApplicationFiled: April 14, 2023Publication date: August 10, 2023Inventors: SANGMIN YOO, JUYOUN KIM, HYUNGJOO NA, BONGSEOK SUH, JOOHO JUNG, EUICHUL HWANG, SUNGMOON LEE
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Patent number: 11658075Abstract: A semiconductor device is provided. The semiconductor device includes a substrate including an active pattern, a gate electrode extending in a first direction and crossing the active pattern which extends in a second direction, a separation structure crossing the active pattern and extending in the first direction, a first gate dielectric pattern disposed on a side surface of the gate electrode, a second gate dielectric pattern disposed on a side surface of the separation structure, and a gate capping pattern covering a top surface of the gate electrode. A level of a top surface of the separation structure is higher than a level of a top surface of the gate capping pattern.Type: GrantFiled: May 3, 2021Date of Patent: May 23, 2023Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Sangmin Yoo, Juyoun Kim, Hyungjoo Na, Bongseok Suh, Jooho Jung, Euichul Hwang, Sungmoon Lee
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Publication number: 20210257264Abstract: A semiconductor device is provided. The semiconductor device includes a substrate including an active pattern, a gate electrode extending in a first direction and crossing the active pattern which extends in a second direction, a separation structure crossing the active pattern and extending in the first direction, a first gate dielectric pattern disposed on a side surface of the gate electrode, a second gate dielectric pattern disposed on a side surface of the separation structure, and a gate capping pattern covering a top surface of the gate electrode. A level of a top surface of the separation structure is higher than a level of a top surface of the gate capping pattern.Type: ApplicationFiled: May 3, 2021Publication date: August 19, 2021Inventors: SANGMIN YOO, JUYOUN KIM, HYUNGJOO NA, BONGSEOK SUH, JOOHO JUNG, EUICHUL HWANG, SUNGMOON LEE
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Patent number: 11062961Abstract: A semiconductor device is provided. The semiconductor device includes a substrate including an active pattern, a gate electrode extending in a first direction and crossing the active pattern which extends in a second direction, a separation structure crossing the active pattern and extending in the first direction, a first gate dielectric pattern disposed on a side surface of the gate electrode, a second gate dielectric pattern disposed on a side surface of the separation structure, and a gate capping pattern covering a top surface of the gate electrode. A level of a top surface of the separation structure is higher than a level of a top surface of the gate capping pattern.Type: GrantFiled: May 10, 2019Date of Patent: July 13, 2021Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Sangmin Yoo, Juyoun Kim, Hyungjoo Na, Bongseok Suh, Jooho Jung, Euichul Hwang, Sungmoon Lee
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Publication number: 20200105625Abstract: A semiconductor device is provided. The semiconductor device includes a substrate including an active pattern, a gate electrode extending in a first direction and crossing the active pattern which extends in a second direction, a separation structure crossing the active pattern and extending in the first direction, a first gate dielectric pattern disposed on a side surface of the gate electrode, a second gate dielectric pattern disposed on a side surface of the separation structure, and a gate capping pattern covering a top surface of the gate electrode. A level of a top surface of the separation structure is higher than a level of a top surface of the gate capping pattern.Type: ApplicationFiled: May 10, 2019Publication date: April 2, 2020Inventors: SANGMIN YOO, Juyoun Kim, Hyungjoo Na, Bongseok Suh, Jooho Jung, Euichul Hwang, Sungmoon Lee
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Patent number: 9832370Abstract: A cognitive sensor and a method of operating the same. The cognitive sensor includes a sensor unit, which generates electric signals in response to outside stimulations; a signal processing unit, which generates sensed data regarding the outside stimulations by processing electric signals generated by the sensor unit; a cognitive circuit unit, which specifies an area of interest in the sensed data processed by the signal processing unit; and an output unit, which outputs the sensed data generated by the signal processing unit, wherein at least a portion of the sensed data output by the output unit is sensed data regarding the area of interest.Type: GrantFiled: July 17, 2015Date of Patent: November 28, 2017Assignee: Samsung Electronics Co., Ltd.Inventors: Seongho Cho, Youngsoo Park, Euichul Hwang, Myoungjae Lee
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Publication number: 20160021302Abstract: A cognitive sensor and a method of operating the same. The cognitive sensor includes a sensor unit, which generates electric signals in response to outside stimulations; a signal processing unit, which generates sensed data regarding the outside stimulations by processing electric signals generated by the sensor unit; a cognitive circuit unit, which specifies an area of interest in the sensed data processed by the signal processing unit; and an output unit, which outputs the sensed data generated by the signal processing unit, wherein at least a portion of the sensed data output by the output unit is sensed data regarding the area of interest.Type: ApplicationFiled: July 17, 2015Publication date: January 21, 2016Inventors: Seongho CHO, Youngsoo PARK, Euichul HWANG, Myoungjae LEE
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Patent number: 7644447Abstract: Provided is a scanning probe microscope capable of precisely analyzing characteristics of samples having an overhang surface structure. The scanning probe microscope comprises a first probe, a first scanner changing a position of the first probe along a straight line, and a second scanner changing a position of a sample in a plane, wherein the straight line in which the position of the first probe is changed by using the first scanner is non-perpendicular to the plane in which the position of the sample is changed by using the second scanner.Type: GrantFiled: November 17, 2006Date of Patent: January 5, 2010Assignee: Park Systems Corp.Inventors: Sang-il Park, Yong-Seok Kim, Jitae Kim, Sang Han Chung, Hyun-Seung Shin, Jung-Rok Lee, Euichul Hwang
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Publication number: 20090200462Abstract: A scanning probe microscope tilts the scanning direction of a z-scanner by a precise amount and with high repeatability using a movable assembly that rotates the scanning direction of the z-scanner with respect to the sample plane. The movable assembly is moved along a curved guide and has grooves that engage with corresponding projections on a stationary frame to precisely position the movable assembly at predefined locations along the curved guide.Type: ApplicationFiled: February 26, 2009Publication date: August 13, 2009Applicant: Park Systems Corp.Inventors: Sang-il PARK, Yong-Seok KIM, Jitae KIM, Sang Han CHUNG, Hyun-Seung SHIN, Jung-Rok LEE, Euichul HWANG
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Publication number: 20080078932Abstract: Provided is a scanning probe microscope capable of precisely analyzing characteristics of samples having an overhang surface structure. The scanning probe microscope comprises a first probe, a first scanner changing a position of the first probe along a straight line, and a second scanner changing a position of a sample in a plane, wherein the straight line in which the position of the first probe is changed by using the first scanner is non-perpendicular to the plane in which the position of the sample is changed by using the second scanner.Type: ApplicationFiled: November 17, 2006Publication date: April 3, 2008Inventors: Sang-il Park, Yong-Seok Kim, Jitae Kim, Sang Han Chung, Hyun-Seung Shin, Jung-Rok Lee, Euichul Hwang