Abstract: A vehicle-to-everything (V2X) communication-based electronic toll collection system (ETCS) according to an embodiment of the present invention includes at least one roadside unit (RSU), a token issuer checking a de-identified token of a vehicle by communicating with an on-board unit (OBU) of the vehicle via the at least one roadside unit, and a clearing house communicating with the token issuer and charging a toll to a driver/owner of the vehicle. The token issuer generates toll information of the vehicle based on the de-identified token of the vehicle and location information of the at least one roadside unit involved in checking the de-identified token.

Abstract: Disclosed is a method and apparatus for detecting anomalies in a system log on the basis of self-supervised learning, using a language model. The method comprises performing preprocessing on the system log, generating a normal token sequence having a preset length by concatenating tokenized log lines of the system log, generating an abnormal token sequence using the normal token sequence, calculating an anomaly score for a determination target token sequence using a sentence classification model, and determining the token sequence as an abnormal system log when the calculated anomaly score is greater than a threshold value.

Abstract: Disclosed is a storage tester capable of individual control for a plurality of storages, which comprises a host terminal for receiving user's control signal for storage test; a communication interface unit transmitting data among the host terminal, an embedded processor and a data engine unit; a data engine unit for generating pattern data and command data and reading the data from the storage; a sequence control module for controlling respectively a plurality of SATA/SAS/PCIe interface units; and SATA/SAS/PCIe interface unit for connecting to the storage through one among SATA, SAS, PCIe interface according to the signal for interface selection generated from the embedded processor and controlling a plurality of storages according to control of the sequence control module by the embedded processor in order to test respectively connected storage.

Abstract: Disclosed is a storage interface apparatus for a solid state drive (SSD) tester which allows a plurality of interfaces to share a single protocol in parts where the protocol is commonly used in a multiple interface for interfacing a storage. The storage interface apparatus for the solid state driver tester includes: a host terminal for receiving a test condition for testing a storage from a user; and a test control unit for generating a test pattern corresponding to the test condition to test the storage. The test control unit includes a storage interface unit for interfacing the storage, and the storage interface unit includes a plurality of interfaces that share a protocol in parts where the protocol is commonly used.

Abstract: Disclosed is a solid state drive tester which reduces the size of the tester and easily changes a function without changing hardware (H/W) by implementing a plurality of devices for testing an SSD as one chip using a Field Programmable Gate Array (FPGA). The solid state drive tester includes: a host terminal receiving a test condition for testing a storage from a user; and a test control unit generating a test pattern corresponding to the test condition, adaptively selecting an interface according to an interface type of the storage to be tested to test the storage using the test pattern, and storing fail data generated during the test in an internal memory. The test control unit is implemented by an FPGA to reduce the size of the tester and easily change a function without hardware.

Abstract: A failure detection apparatus for a solid state driver tester is provided. The failure detection apparatus includes a host terminal for receiving a test condition for testing a storage from a user and a test control unit for creating a test pattern according to the test condition or creating a test pattern at random, and adaptively selects an interface according to a type of the storage to be tested to test the storage with the test pattern. The test control unit includes a plurality of buffer memories for storing readout data of the storage, stores the readout data in the buffer memories in an interleaving manner, and endows comparison of the created test pattern and the readout data stored in the buffer memories with continuity to test the storage in real time.

Abstract: Disclosed is an error generating apparatus of a solid state drive tester. The error processing operation of the storage is tested by inserting errors into a specific instruction to be transmitted to the storage, and detecting the results of the error processing operation of the storage when testing the storage. The error generating apparatus includes a host terminal for receiving a test condition for a test of a storage from a user, and a test control unit for generating a test pattern according to the test condition or generating a test pattern randomly, generating error data used to test an error characteristic of the storage, and testing the storage based on the test pattern and a normal instruction or an error instruction which is formed by inserting the error data into the normal instruction.

Abstract: Disclosed is a solid state drive tester which divides the functions of generating and comparing test pattern data and Frame Information Structure (FIS) data with each other into each other to implement the functions as separate logics, so that entire test time is decreased by reducing load of a processor. The solid state drive tester includes a host terminal for receiving a test condition for testing a storage from a user, and a test control unit creating a test pattern corresponding to the test condition, and adaptively selecting an interface according to an interface type of the storage to be tested to test the storage using the test pattern, wherein the test control unit is divided into a control module for controlling the test of the storage and a test execution module for practically executing the test in hardware to test a plurality of storages in real time.

Abstract: Disclosed is a storage tester capable of individual control for a plurality of storages, which comprises a host terminal for receiving user's control signal for storage test; a communication interface unit transmitting data among the host terminal, an embedded processor and a data engine unit; a data engine unit for generating pattern data and command data and reading the data from the storage; a sequence control module for controlling respectively a plurality of SATA/SAS/PCIe interface units; and SATA/SAS/PCIe interface unit for connecting to the storage through one among SATA, SAS, PCIe interface according to the signal for interface selection generated from the embedded processor and controlling a plurality of storages according to control of the sequence control module by the embedded processor in order to test respectively connected storage.

Abstract: Disclosed is a solid state drive tester which divides the functions of generating and comparing test pattern data and Frame Information Structure (FIS) data with each other into each other to implement the functions as separate logics, so that entire test time is decreased by reducing load of a processor. The solid state drive tester includes a host terminal for receiving a test condition for testing a storage from a user, and a test control unit creating a test pattern corresponding to the test condition, and adaptively selecting an interface according to an interface type of the storage to be tested to test the storage using the test pattern, wherein the test control unit is divided into a control module for controlling the test of the storage and a test execution module for practically executing the test in hardware to test a plurality of storages in real time.

Abstract: Disclosed is a solid state drive tester which reduces the size of the tester and easily changes a function without changing hardware (H/W) by implementing a plurality of devices for testing an SSD as one chip using a Field Programmable Gate Array (FPGA). The solid state drive tester includes: a host terminal receiving a test condition for testing a storage from a user; and a test control unit generating a test pattern corresponding to the test condition, adaptively selecting an interface according to an interface type of the storage to be tested to test the storage using the test pattern, and storing fail data generated during the test in an internal memory. The test control unit is implemented by an FPGA to reduce the size of the tester and easily change a function without hardware.

Abstract: Disclosed is a failure detection apparatus for a solid state driver tester, the failure detection apparatus including: a host terminal for receiving a test condition for testing a storage from a user; and a test control unit for creating a test pattern according to the test condition or creating a test pattern at random, and adaptively selecting an interface according to a type of the storage to be tested to test the storage with the test pattern. The test control unit includes a plurality of buffer memories for storing readout data of the storage, stores the readout data in the buffer memories in an interleaving manner, and endows comparison of the created test pattern and the readout data stored in the buffer memories with continuity to test the storage in real time.

Abstract: Disclosed is an error generating apparatus of a solid state drive tester. The error processing operation of the storage is tested by inserting errors into a specific instruction to be transmitted to the storage, and detecting the results of the error processing operation of the storage when testing the storage. The error generating apparatus includes a host terminal for receiving a test condition for a test of a storage from a user, and a test control unit for generating a test pattern according to the test condition or generating a test pattern randomly, generating error data used to test an error characteristic of the storage, and testing the storage based on the test pattern and a normal instruction or an error instruction which is formed by inserting the error data into the normal instruction.

Abstract: Disclosed is a storage interface apparatus for a solid state drive (SSD) tester which allows a plurality of interfaces to share a single protocol in parts where the protocol is commonly used in a multiple interface for interfacing a storage. The storage interface apparatus for the solid state driver tester includes: a host terminal for receiving a test condition for testing a storage from a user; and a test control unit for generating a test pattern corresponding to the test condition to test the storage. The test control unit includes a storage interface unit for interfacing the storage, and the storage interface unit includes a plurality of interfaces that share a protocol in parts where the protocol is commonly used.