Abstract: Provided are a semiconductor device and a method of fabricating the same. The semiconductor device includes a semiconductor substrate, a first and a second diffusion region formed under a surface of the semiconductor substrate, a gate and a sidewall spacer stacked on the semiconductor substrate, wherein the first diffusion region is at least one active region not being intersected by the gate and the sidewall spacer, wherein the second diffusion region includes a part of an active region intersecting the gate and the sidewall space, wherein there is no gate insulating layer between the gate and the semiconductor substrate.

Abstract: The nonvolatile memory device includes a semiconductor substrate, a first and a second diffusion regions formed under a surface of the semiconductor substrate, a storage layer formed on the semiconductor substrate, a gate stacked on the storage layer, wherein the first diffusion region may at least one of active regions being separated by a part of the semiconductor substrate forming a channel region, wherein the second diffusion region may include an active region intersecting the gate insulating layer, wherein the storage layer may include an insulating layer or a variable resistor, and may service as a data storage layer to store data, and may be selected by a structure including the first and the second diffusion regions.

Abstract: The nonvolatile memory device includes a semiconductor substrate, a first and a second diffusion regions formed under a surface of the semiconductor substrate, a storage layer formed on the semiconductor substrate, a gate stacked on the storage layer, wherein the first diffusion region may at least one of active regions being separated by a part of the semiconductor substrate forming a channel region., wherein the second diffusion region may include an active region intersecting the gate insulating layer, wherein the storage layer may include an insulating layer or a variable resistor, and may service as a data storage layer to store data, and may be selected by a structure including the first and the second diffusion regions.

Abstract: The nonvolatile memory device includes a memory cell having a transistor in which an insulating isolation layer is formed in a channel region. The nonvolatile memory device includes a metal-oxide-semiconductor (MOS) transistor as a basic component. An insulating isolation layer is formed in at least a channel region, and a gate insulating layer includes an insulating layer or a variable resistor and serves as a data storage. A gate includes a metal layer formed in a lower portion thereof. First source and drain regions are lightly doped with a dopant, and second source and drain regions are heavily doped with a dopant.

Abstract: Disclosed is a nonvolatile memory device including a memory cell having a transistor in which a structure is formed to be programmable and a method of fabricating the memory device. The memory cell includes one transistor serving as a basic structure, a gate insulating layer is formed of an insulating layer or a variable resistor, and a channel region includes a diode region, a source-drain connecting region, or an insulating isolation layer. The diode region, source-drain connecting region, or insulating isolation layer is formed in a region including a channel region between the source and drain regions in the semiconductor substrate. The gate includes a conductive layer, and the gate insulating layer includes an insulating layer or a variable resistor, a portion of the gate insulating layer between the gate and the diode region serves as a storage layer.

Abstract: A programmable non-volatile memory including a memory cell includes a transistor acting as an anti-fuse and two diodes for access. The memory cell that can store two bits and includes a transistor acting as an anti-fuse and two diodes for access, wherein the cell transistor includes: the source electrode formed by a metal; the first diode as the source region contact structure; the drain electrode formed by a metal; and the second diode as the drain region contact structure wherein the cell transistor, the oxide layer between the source area and the gate is the first anti-fuse the first storage; the oxide layer between the drain area and the gate is the second anti-fuse the second storage; the two diodes are connected in series to access the two anti-fuses.

Abstract: A highly integrated programmable non-volatile memory and a manufacturing method thereof are provided. More particularly, a memory device including an antifuse and a diode, or a variable resistor and a diode, an operation method thereof, and a manufacturing method of a plurality of memory cells capable of increasing the integration density by utilizing a vertical space are provided. The highly integrated programmable non-volatile memory includes first stepped cells and second stepped cells formed to have different heights. The first stepped cells are formed on a horizontal plane with a high height, and the second stepped cells are formed on a horizontal plane with a low height.

Abstract: The nonvolatile memory device includes a memory cell having a transistor in which an insulating isolation layer is formed in a channel region. The nonvolatile memory device includes a metal-oxide-semiconductor (MOS) transistor as a basic component. An insulating isolation layer is formed in at least a channel region, and a gate insulating layer includes an insulating layer or a variable resistor and serves as a data storage. A gate includes a metal layer formed in a lower portion thereof. First source and drain regions are lightly doped with a dopant, and second source and drain regions are heavily doped with a dopant.

Abstract: A non-volatile memory and a method of fabricating the same, more particularly, a non-volatile memory in which memory cells each includes an anti-fuse and a diode or a variable resistor and a diode are stacked in a multilayer laminate structure without increasing a horizontal area, to effectively utilize a vertical space and thereby significantly increase a degree of integration so that the memory cells are able to be highly integrated and perform high-speed operation, and a method of fabricating the non-volatile memory.

Abstract: A highly integrated programmable non-volatile memory and a manufacturing method thereof are provided. More particularly, a memory device including an antifuse and a diode, or a variable resistor and a diode, an operation method thereof, and a manufacturing method of a plurality of memory cells capable of increasing the integration density by utilizing a vertical space are provided. The highly integrated programmable non-volatile memory includes first stepped cells and second stepped cells formed to have different heights. The first stepped cells are formed on a horizontal plane with a high height, and the second stepped cells are formed on a horizontal plane with a low height.

Abstract: A programmable non-volatile memory including a memory cell includes a transistor acting as an anti-fuse and two diodes for access. The memory cell that can store two bits and includes a transistor acting as an anti-fuse and two diodes for access, wherein the cell transistor includes: the source electrode formed by a metal; the first diode as the source region contact structure; the drain electrode formed by a metal; and the second diode as the drain region contact structure wherein the cell transistor, the oxide layer between the source area and the gate is the first anti-fuse the first storage; the oxide layer between the drain area and the gate is the second anti-fuse the second storage; the two diodes are connected in series to access the two anti-fuses.

Abstract: A MOS semiconductor device and the manufacturing method thereof relates to a highly integrated MOS device having a three-dimensional structure. The method of manufacturing the highly integrated MOS device compromises the steps of forming a layer of gate insulator on the semiconductor substrate, planarizing surface after filling a trench with an insulating material, forming a plurality of MOS transistors on the horizontal planes of a semiconductor substrate, forming vertical planes from the semiconductor substrate, and forming a plurality of MOS transistors on the vertical planes.