Patents by Inventor Eun-Ee Cho

Eun-Ee Cho has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for measuring bit error rate in an OFDM communication system
    Patent number: 6810020
    Abstract: Disclosed is an apparatus for measuring a bit error rate (BER) in an orthogonal frequency division multiplexing (OFDM) communication system. A transmitter includes a pilot pattern inserter for inserting a first reference pilot pattern in subchannels of input data, and an OFDM modulator for OFDM-modulating the reference pilot pattern-inserted transmission data. A receiver includes a pilot pattern detector for OFDM-demodulating a data symbol received in a frame unit and detecting only a pilot pattern, and a BER operator for comparing the demodulated pilot pattern with a second reference pilot pattern, detecting and accumulating the number of pilot errors, and measuring a bit error rate by dividing the accumulated number of the pilot errors by the number of total received pilot patterns.
    Type: Grant
    Filed: January 29, 2001
    Date of Patent: October 26, 2004
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Eun-Ee Cho, Ho Kim, Jong-Hyeon Park
  • Apparatus and method for measuring bit error rate in an OFDM communication system
    Publication number: 20020004920
    Abstract: Disclosed is an apparatus for measuring a bit error rate (BER) in an orthogonal frequency division multiplexing (OFDM) communication system. A transmitter includes a pilot pattern inserter for inserting a first reference pilot pattern in subchannels of input data, and an OFDM modulator for OFDM-modulating the reference pilot pattern-inserted transmission data. A receiver includes a pilot pattern detector for OFDM-demodulating a data symbol received in a frame unit and detecting only a pilot pattern, and a BER operator for comparing the demodulated pilot pattern with a second reference pilot pattern, detecting and accumulating the number of pilot errors, and measuring a bit error rate by dividing the accumulated number of the pilot errors by the number of total received pilot patterns.
    Type: Application
    Filed: January 29, 2001
    Publication date: January 10, 2002
    Applicant: Samsung Thomson-CSF System Co., Ltd.
    Inventors: Eun-Ee Cho, Ho Kim, Jong-Hyeon Park