Abstract: A liquid crystal display includes a substrate, first and second pixels neighboring in a row direction, third and fourth pixels respectively neighboring the first and second pixel in a column direction, wherein the pixels are formed on the substrate, first and second data lines formed on the substrate that transmit a data voltage, and a voltage line disposed between the first and second data lines. The pixels respectively include a first switching element connected to the first or second data line, a second switching element connected to the voltage line, a first pixel electrode connected to the first switching element, and a second pixel electrode connected to the second switching element. A position of the first pixel electrode with respect to the second pixel electrode of the first pixel is opposite to a position of the first pixel electrode with respect to the second pixel electrode of the second pixel.

Abstract: A built off testing apparatus coupled between a semiconductor device and an external testing apparatus to test a semiconductor device. The built off testing apparatus can include a frequency multiplying unit to generate a test clock frequency by multiplying the frequency of a clock input by the external testing apparatus according to the operation speed of the semiconductor device, an instruction decoding unit to generate test information by decoding test signals input by the external testing apparatus according to the test clock frequency, and a test execution unit to test the semiconductor device according to the test information, and can determine whether the semiconductor device is failed or not based on test data output by the semiconductor device, and can transmit resulting data to the external testing apparatus.

Abstract: An image processing apparatus and control method thereof are provided. The image processing apparatus includes a plurality of connectors that is connected to a plurality of display apparatuses having a predetermined resolution, an image processor that divides a source image corresponding to the number of the plurality of display apparatuses connected through the connectors, a plurality of scalers that are provided corresponding to the plurality of connectors connected to the plurality of display apparatuses, and scales a resolution of the divided source image to correspond with the resolution of the corresponding display apparatuses and a controller that transmits the plurality of adjusted source images to the plurality of display apparatuses.

Abstract: A built off testing apparatus coupled between a semiconductor device and an external testing apparatus to test a semiconductor device. The built off testing apparatus can include a frequency multiplying unit to generate a test clock frequency by multiplying the frequency of a clock input by the external testing apparatus according to the operation speed of the semiconductor device, an instruction decoding unit to generate test information by decoding test signals input by the external testing apparatus according to the test clock frequency, and a test execution unit to test the semiconductor device according to the test information, and can determine whether the semiconductor device is failed or not based on test data output by the semiconductor device, and can transmit resulting data to the external testing apparatus.

Abstract: A test interface device includes a serializer, an optical transmitter, an optical receiver, and a deserializer. The serializer receives parallel test signals from automatic test equipment, and serializes the parallel test signals into a serial test signal. The optical transmitter converts the serial test signal into an optical test signal. The optical receiver receives the optical test signal from the optical transmitter, and converts the optical test signal into the serial test signal. The deserializer deserializes the serial test signal into the parallel test signals, and transmits the parallel test signals to a device under test. As a result, signal transfer speed may be improved and optical resource usage may be reduced.

Abstract: Disclosed is an Internet group management system of a push-type multicast in a passive access network, and a method thereof. The Internet group management system of a push-type multicast supporting Internet group management with respect to a packet stream simultaneously being transmitted to a subscriber accessing the same node via a passive access network where at least one subscriber accesses a single node, the system including an input packet classifying unit to sort a multimedia contents packet corresponding to a contents transmission packet from the packet stream, and a program managing unit to construct a broadcasting program table having information of the sorted multimedia contents packet, to determine, based on the constructed broadcasting program table, a reception condition of a requested program that is requested by a user, and to output a multimedia contents packet corresponding to the requested program.

Abstract: Provided are a video on demand (VOD) transmission/reception method and system using a divided transport stream (TS). The VOD transmission method includes setting a division coefficient for dividing a TS; dividing the TS into a unicast segment and multicast segments according to the division coefficient; and transmitting the unicast segment by using a unicast method and transmitting the multicast segments by using a multicast method.

Abstract: A preamble noise cancellation circuit according to an aspect of the invention may include: a coupler dividing an input signal; a preamble noise detection unit subtracting a predetermined reference preamble signal from a received preamble signal output from the coupler to detect preamble noise included in the received preamble signal; and a noise cancellation unit subtracting the preamble noise detected by the preamble noise detection unit from the received preamble signal output from the coupler.

Abstract: Disclosed is an Internet group management system of a push-type multicast in a passive access network, and a method thereof. The Internet group management system of a push-type multicast supporting Internet group management with respect to a packet stream simultaneously being transmitted to a subscriber accessing the same node via a passive access network where at least one subscriber accesses a single node, the system including an input packet classifying unit to sort a multimedia contents packet corresponding to an IPTV contents transmission packet from the packet stream, and a program managing unit to construct a broadcasting program table having information of the sorted multimedia contents packet, to determine, based on the constructed broadcasting program table, a reception condition of a requested program that is requested by a user, and to output a multimedia contents packet corresponding to the requested program.

Abstract: A film formation process is performed to form a silicon nitride film on a target substrate within a process field configured to be selectively supplied with a first process gas containing a silane family gas and a second process gas containing a nitriding gas. The method is preset to compose the film formation process of a main stage with an auxiliary stage set at one or both of beginning and ending of the film formation process. The main stage includes an excitation period of supplying the second process gas to the process field while exciting the second process gas by an exciting mechanism. The auxiliary stage includes no excitation period of supplying the second process gas to the process field while exciting the second process gas by the exciting mechanism.

Abstract: A display panel includes a display area including a gate line and a data line, a gate driver integrated on a substrate and connected to one end of the gate line, the gate driver including a plurality of a stage, a signal line connected to the stages; and a blocking member disposed on the signal line and overlapped with the signal line, the blocking member including a plurality of an opening.

Abstract: A liquid crystal display includes a substrate, first and second pixels neighboring in a row direction, third and fourth pixels respectively neighboring the first and second pixel in a column direction, wherein the pixels are formed on the substrate, first and second data lines formed on the substrate that transmit a data voltage, and a voltage line disposed between the first and second data lines. The pixels respectively include a first switching element connected to the first or second data line, a second switching element connected to the voltage line, a first pixel electrode connected to the first switching element, and a second pixel electrode connected to the second switching element. A position of the first pixel electrode with respect to the second pixel electrode of the first pixel is opposite to a position of the first pixel electrode with respect to the second pixel electrode of the second pixel.

Abstract: A semiconductor device test apparatus is provided. The semiconductor device test apparatus includes a test unit on which a semiconductor device under test is disposed, and an automatic test equipment (ATE) unit that inputs a test signal to the test unit and reads a test result signal output by the test unit. The semiconductor device test apparatus includes an interface unit that is interposed between the test unit and the ATE unit, and that compares the test signal with the test result signal and outputs to the ATE unit comparison signals indicating whether the semiconductor device is a failure or not or whether a specific bit failure has occurred or not.

Abstract: A built off testing apparatus coupled between a semiconductor device and an external testing apparatus to test a semiconductor device. The built off testing apparatus can include a frequency multiplying unit to generate a test clock frequency by multiplying the frequency of a clock input by the external testing apparatus according to the operation speed of the semiconductor device, an instruction decoding unit to generate test information by decoding test signals input by the external testing apparatus according to the test clock frequency, and a test execution unit to test the semiconductor device according to the test information, and can determine whether the semiconductor device is failed or not based on test data output by the semiconductor device, and can transmit resulting data to the external testing apparatus.

Abstract: A semiconductor device test apparatus is provided. The semiconductor device test apparatus includes a test unit on which a semiconductor device under test is disposed, and an automatic test equipment (ATE) unit that inputs a test signal to the test unit and reads a test result signal output by the test unit. The semiconductor device test apparatus includes an interface unit that is interposed between the test unit and the ATE unit, and that compares the test signal with the test result signal and outputs to the ATE unit comparison signals indicating whether the semiconductor device is a failure or not or whether a specific bit failure has occurred or not.

Abstract: A test interface device includes a serializer, an optical transmitter, an optical receiver, and a deserializer. The serializer receives parallel test signals from automatic test equipment, and serializes the parallel test signals into a serial test signal. The optical transmitter converts the serial test signal into an optical test signal. The optical receiver receives the optical test signal from the optical transmitter, and converts the optical test signal into the serial test signal. The deserializer deserializes the serial test signal into the parallel test signals, and transmits the parallel test signals to a device under test. As a result, signal transfer speed may be improved and optical resource usage may be reduced.

Abstract: A preamble noise cancellation circuit according to an aspect of the invention may include: a coupler dividing an input signal; a preamble noise detection unit subtracting a predetermined reference preamble signal from a received preamble signal output from the coupler to detect preamble noise included in the received preamble signal; and a noise cancellation unit subtracting the preamble noise detected by the preamble noise detection unit from the received preamble signal output from the coupler.

Abstract: In an interface device for wireless testing capable of testing a semiconductor chip in a non-contact manner, a semiconductor device and a semiconductor package including the same, and a method for wirelessly testing a semiconductor device using the same are provided, the interface device for wireless testing includes an interface substrate, interface antennas on the interface substrate, and interface transmitting and receiving circuits on the interface substrate, wherein the interface transmitting and receiving circuits are electrically connected to input/output pads of a semiconductor chip via interface vias passing through the interface substrate.

Abstract: Provided are a video on demand (VOD) transmission/reception method and system using a divided transport stream (TS). The VOD transmission method includes setting a division coefficient for dividing a TS; dividing the TS into a unicast segment and multicast segments according to the division coefficient; and transmitting the unicast segment by using a unicast method and transmitting the multicast segments by using a multicast method.

Abstract: A film formation process is performed to form a silicon nitride film on a target substrate within a process field configured to be selectively supplied with a first process gas containing a silane family gas and a second process gas containing a nitriding gas. The method is preset to compose the film formation process of a main stage with an auxiliary stage set at one or both of beginning and ending of the film formation process. The main stage includes an excitation period of supplying the second process gas to the process field while exciting the second process gas by an exciting mechanism. The auxiliary stage includes no excitation period of supplying the second process gas to the process field while exciting the second process gas by the exciting mechanism.