Patents by Inventor Euy Hyun CHO

Euy Hyun CHO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Sample test method, microfluidic device, and test device
    Patent number: 10126232
    Abstract: A sample test method, microfluidic device, and test device efficiently and accurately compensates for interference of an interfering substance present in a sample using optical measurement without addition of a separate reagent for detecting the interfering substance. The sample test method includes: measuring an optical characteristic value of a target substance present in a sample; measuring an optical characteristic value of an interfering substance present in the sample; and determining a concentration of the target substance for which interference of the interfering substance is compensated for based on the optical characteristic value of the interfering substance.
    Type: Grant
    Filed: February 8, 2018
    Date of Patent: November 13, 2018
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Sung Ha Park, Sang Bum Park, Beom Seok Lee, Kui Hyun Kim, Joo Hee Park, Kyung Mi Song, Euy Hyun Cho, Ha Na Kim
  • Structure for optical analysis and ink composition for manufacturing the same
    Patent number: 10106694
    Abstract: Disclosed herein are a structure for optical analysis that is capable of optically analyzing a small amount of a sample and an ink composition for manufacturing the same. A structure for optical analysis includes a support and an ink structure coupled to the support and configured to form a chamber on one surface of the support. The ink structure includes a first ink structural component configured to form a body of the ink structure and a second ink structural component formed at a lower portion of a side surface of the first ink, such that the first ink structural component and the second ink structural component have different slopes with respect to a direction of a center of the chamber.
    Type: Grant
    Filed: June 29, 2015
    Date of Patent: October 23, 2018
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Euy Hyun Cho, Ji Yun Kang, Ji Won Kim, Sung Ha Park, Beom Seok Lee
  • SAMPLE TEST METHOD, MICROFLUIDIC DEVICE, AND TEST DEVICE
    Publication number: 20180180536
    Abstract: A sample test method, microfluidic device, and test device efficiently and accurately compensates for interference of an interfering substance present in a sample using optical measurement without addition of a separate reagent for detecting the interfering substance. The sample test method includes: measuring an optical characteristic value of a target substance present in a sample; measuring an optical characteristic value of an interfering substance present in the sample; and determining a concentration of the target substance for which interference of the interfering substance is compensated for based on the optical characteristic value of the interfering substance.
    Type: Application
    Filed: February 8, 2018
    Publication date: June 28, 2018
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Sung Ha PARK, Sang Bum PARK, Beom Seok LEE, Kui Hyun KIM, Joo Hee PARK, Kyung Mi SONG, Euy Hyun CHO, Ha Na KIM
  • Sample test method, microfluidic device, and test device
    Patent number: 9927351
    Abstract: A sample test method, microfluidic device, and test device efficiently and accurately compensates for interference of an interfering substance present in a sample using optical measurement without addition of a separate reagent for detecting the interfering substance. The sample test method includes: measuring an optical characteristic value of a target substance present in a sample; measuring an optical characteristic value of an interfering substance present in the sample; and determining a concentration of the target substance for which interference of the interfering substance is compensated for based on the optical characteristic value of the interfering substance.
    Type: Grant
    Filed: August 12, 2015
    Date of Patent: March 27, 2018
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Sung Ha Park, Sang Bum Park, Beom Seok Lee, Kui Hyun Kim, Joo Hee Park, Kyung Mi Song, Euy Hyun Cho, Ha Na Kim
  • STRUCTURE FOR OPTICAL ANALYSIS AND INK COMPOSITION FOR MANUFACTURING THE SAME
    Publication number: 20160168398
    Abstract: Disclosed herein are a structure for optical analysis that is capable of optically analyzing a small amount of a sample and an ink composition for manufacturing the same. A structure for optical analysis includes a support and an ink structure coupled to the support and configured to form a chamber on one surface of the support. The ink structure includes a first ink structural component configured to form a body of the ink structure and a second ink structural component formed at a lower portion of a side surface of the first ink, such that the first ink structural component and the second ink structural component have different slopes with respect to a direction of a center of the chamber.
    Type: Application
    Filed: June 29, 2015
    Publication date: June 16, 2016
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Euy Hyun CHO, Ji Yun KANG, Ji Won KIM, Sung Ha PARK, Beom Seok LEE
  • SAMPLE TEST METHOD, MICROFLUIDIC DEVICE, AND TEST DEVICE
    Publication number: 20160047740
    Abstract: A sample test method, microfluidic device, and test device efficiently and accurately compensates for interference of an interfering substance present in a sample using optical measurement without addition of a separate reagent for detecting the interfering substance. The sample test method includes: measuring an optical characteristic value of a target substance present in a sample; measuring an optical characteristic value of an interfering substance present in the sample; and determining a concentration of the target substance for which interference of the interfering substance is compensated for based on the optical characteristic value of the interfering substance.
    Type: Application
    Filed: August 12, 2015
    Publication date: February 18, 2016
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Sung Ha PARK, Sang Bum PARK, Beom Seok LEE, Kui Hyun KIM, Joo Hee PARK, Kyung Mi SONG, Euy Hyun CHO, Ha Na KIM