Patents by Inventor Eva Simbuerger

Eva Simbuerger has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9927603
    Abstract: A switch which reduces the voltage between the photocathode and the first dynode in the activated switching state compared to the deactivated switching state and a control unit which is adapted to move a target spot, which can be illuminated by means of the light source, over a scanning field by means of a deflecting unit. The control unit activates the switch when the target spot enters a given region of the scanning field and deactivates the switch when the target spot exits the region.
    Type: Grant
    Filed: June 15, 2012
    Date of Patent: March 27, 2018
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Mirko Liedtke, Eva Simbuerger, Daniel Schwedt
  • Publication number: 20140138517
    Abstract: A switch which reduces the voltage between the photocathode and the first dynode in the activated switching state compared to the deactivated switching state and a control unit which is adapted to move a target spot, which can be illuminated by means of the light source, over a scanning field by means of a deflecting unit. The control unit activates the switch when the target spot enters a given region of the scanning field and deactivates the switch when the target spot exits the region.
    Type: Application
    Filed: June 15, 2012
    Publication date: May 22, 2014
    Inventors: Mirko Liedtke, Eva Simbuerger, Daniel Schwedt
  • Patent number: 7593158
    Abstract: A method in which specimens are examined using a microscope. For an illuminated specimen, spatially coherent light with at least one continuous wavelength range or a continuously tunable wavelength range is generated, and one or more wavelengths or wavelength ranges in the illumination light are selected in dependence on the prespecified method of examination. The specimen is then illuminated with the illumination light with the selected wavelengths or wavelength ranges, the illumination light and the emission light coming from the specimen are then subsequently separated, whereby the back radiated illumination light is suppressed in the detection beam before the detection and the emission light is detected. In such a method, the selection of the wavelengths or the wavelength ranges of the illumination light is tuned by means of the separation of the detection light and the illumination light and the suppression of the illumination light in such a manner that a prespecified control variable (R) is optimized.
    Type: Grant
    Filed: January 12, 2006
    Date of Patent: September 22, 2009
    Assignee: Carl Zeiss Micro Imaging GmbH
    Inventors: Stefan Wilhelm, Eva Simbürger, Michael Kempe
  • Patent number: 7119898
    Abstract: A method for the detection and evaluation of the light generated in a fluorescing specimen by a short pulse laser, wherein at least a first and a second fluorophore and/or a self-fluorescing specimen are separately irradiated with different wavelengths and the specimen light is recorded in a wavelength-dependent manner with at least one nondescanned detector as reference spectrum and a separation into individual spectra is carried out during the irradiation of at least two fluorophores and/or self-fluorescing specimens simultaneously from the measured spectrum and the reference spectra through regression analysis, wherein the wavelength of the short pulse laser is advantageously changed continuously in at least one wavelength region.
    Type: Grant
    Filed: January 23, 2004
    Date of Patent: October 10, 2006
    Assignee: Carl Zeiss Jena GmbH
    Inventors: Bernhard Zimmermann, Eva Simbuerger, Mary Dickinson
  • Publication number: 20040246478
    Abstract: A method for the detection and evaluation of the light generated in a fluorescing specimen by a short pulse laser, wherein at least a first and a second fluorophore and/or a self-fluorescing specimen are separately irradiated with different wavelengths and the specimen light is recorded in a wavelength-dependent manner with at least one nondescanned detector as reference spectrum and a separation into individual spectra is carried out during the irradiation of at least two fluorophores and/or self-fluorescing specimens simultaneously from the measured spectrum and the reference spectra through regression analysis, wherein the wavelength of the short pulse laser is advantageously changed continuously in at least one wavelength region.
    Type: Application
    Filed: January 23, 2004
    Publication date: December 9, 2004
    Inventors: Bernhard Zimmermann, Eva Simbuerger, Mary Dickinson