Patents by Inventor Eva Simburger

Eva Simburger has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for the examination of specimens
    Patent number: 7593158
    Abstract: A method in which specimens are examined using a microscope. For an illuminated specimen, spatially coherent light with at least one continuous wavelength range or a continuously tunable wavelength range is generated, and one or more wavelengths or wavelength ranges in the illumination light are selected in dependence on the prespecified method of examination. The specimen is then illuminated with the illumination light with the selected wavelengths or wavelength ranges, the illumination light and the emission light coming from the specimen are then subsequently separated, whereby the back radiated illumination light is suppressed in the detection beam before the detection and the emission light is detected. In such a method, the selection of the wavelengths or the wavelength ranges of the illumination light is tuned by means of the separation of the detection light and the illumination light and the suppression of the illumination light in such a manner that a prespecified control variable (R) is optimized.
    Type: Grant
    Filed: January 12, 2006
    Date of Patent: September 22, 2009
    Assignee: Carl Zeiss Micro Imaging GmbH
    Inventors: Stefan Wilhelm, Eva Simbürger, Michael Kempe
  • Method and apparatus for the examination of probes
    Publication number: 20070133086
    Abstract: A method in which probes are examined by means a microscope. For an illuminated sample, spatially coherent light with at least one continuous wavelength range or a continuously tunable wavelength range is generated, and one or more wavelengths or wavelength ranges in the illumination light are selected in dependence on the prespecified method of examination. The probe is then illuminated with the illumination light with the selected wavelengths or wavelength ranges, the illumination light and the emission light coming from the probe are then subsequently separated, whereby the back radiated illumination light is suppressed in the detection beam before the detection and the emission light is detected. In such a method, the selection of the wavelengths or the wavelength ranges of the illumination light is tuned by means of the separation of the detection light and the illumination light and the suppression of the illumination light in such a manner that a prespecified control variable (R) is optimized.
    Type: Application
    Filed: January 12, 2006
    Publication date: June 14, 2007
    Inventors: Stefan Wilhelm, Eva Simburger, Michael Kempe