Patents by Inventor Eva Wolpers

Eva Wolpers has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9251296
    Abstract: A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which may be specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.
    Type: Grant
    Filed: March 26, 2007
    Date of Patent: February 2, 2016
    Assignee: National Instruments Corporation
    Inventors: Andreas Peter Haub, Stefan Romainczyk, Ralf Deininger, Helmut Helpenstein, Andreas Krantz, Myrle H. Krantz, Eva Wolpers
  • Patent number: 8386464
    Abstract: A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which may be specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.
    Type: Grant
    Filed: March 26, 2007
    Date of Patent: February 26, 2013
    Assignee: National Instruments Corporation
    Inventors: Andreas Peter Haub, Stefan Romainczyk, Ralf Deininger, Helmut Helpenstein, Andreas Krantz, Myrle H. Krantz, Eva Wolpers
  • Patent number: 8099400
    Abstract: A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which may be specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.
    Type: Grant
    Filed: March 26, 2007
    Date of Patent: January 17, 2012
    Assignee: National Instruments Corporation
    Inventors: Andreas Peter Haub, Stefan Romainczyk, Ralf Deininger, Helmut Helpenstein, Andreas Krantz, Myrle H. Krantz, Eva Wolpers
  • Publication number: 20080046414
    Abstract: A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which may be specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.
    Type: Application
    Filed: March 26, 2007
    Publication date: February 21, 2008
    Inventors: Andreas Peter Haub, Stefan Romainczyk, Ralf Deininger, Helmut Helpenstein, Andreas Krantz, Myrle H. Krantz, Eva Wolpers
  • Publication number: 20080046457
    Abstract: A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which may be specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.
    Type: Application
    Filed: March 26, 2007
    Publication date: February 21, 2008
    Inventors: Andreas Peter Haub, Stefan Romainczyk, Ralf Deininger, Helmut Helpenstein, Andreas Krantz, Myrle H. Krantz, Eva Wolpers
  • Publication number: 20080046838
    Abstract: A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which may be specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.
    Type: Application
    Filed: March 26, 2007
    Publication date: February 21, 2008
    Inventors: Andreas Peter Haub, Stefan Romainczyk, Ralf Deininger, Helmut Helpenstein, Andreas Krantz, Myrle H. Krantz, Eva Wolpers