Patents by Inventor Eval Shekel

Eval Shekel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Spatial and spectral wavefront analysis and measurement
    Patent number: 7542144
    Abstract: A method and apparatus for wavefront analysis including obtaining a plurality of differently phase changed transformed wavefronts corresponding to a wavefront being analyzed which has an amplitude and a phase, obtaining a plurality of intensity maps of the plurality of phase changed transformed wavefronts and employing the plurality of intensity maps to obtain an output indicating the amplitude and phase of the wavefront being analyzed.
    Type: Grant
    Filed: November 30, 2007
    Date of Patent: June 2, 2009
    Assignee: Icos Vision Systems N.V.
    Inventors: Yoel Arieli, Shay Wolfling, Eval Shekel
  • Spatial and spectral wavefront analysis and measurement
    Publication number: 20080088851
    Abstract: A method and apparatus for wavefront analysis including obtaining a plurality of differently phase changed transformed wavefronts corresponding to a wavefront being analyzed which has an amplitude and a phase, obtaining a plurality of intensity maps of the plurality of phase changed transformed wavefronts and employing the plurality of intensity maps to obtain an output indicating the amplitude and phase of the wavefront being analyzed.
    Type: Application
    Filed: November 30, 2007
    Publication date: April 17, 2008
    Inventors: Yoel Arieli, Shay Wolfling, Eval Shekel