Patents by Inventor Evan Douglas Smith

Evan Douglas Smith has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220390515
    Abstract: A test and measurement system includes a machine learning system configured to communicate with a test automation system, a user interface configured to allow a user to provide one or more user inputs and to provide results to the user, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to receive one or more user inputs through the user interface, the one or more user inputs at least identifying a selected machine learning system configuration to be used to configure the machine learning system, receive a waveform created by operation of a device under test, apply the configured machine learning system to analyze the waveform, and provide an output of predicted metadata about the waveform.
    Type: Application
    Filed: June 2, 2022
    Publication date: December 8, 2022
    Applicant: Tektronix, Inc.
    Inventors: John J. Pickerd, Mark Anderson Smith, Kan Tan, Evan Douglas Smith, Justin E. Patterson, Heike Tritschler
  • Publication number: 20220334180
    Abstract: A test and measurement system includes a clock recovery circuit configured to receive a signal from a device under test and to produce a pattern trigger signal, a flash array digitizer having an array of counters having rows and columns configured to store a waveform image representing the signal received from the device under test, a row selection circuit configured to select a row in the array of counters, and a ring counter circuit configured to receive a clock signal, select a column in the array of counters, produce end of row signals, and produce a fill complete signal upon all of the columns having been swept, the fill complete signal indicating completion of the waveform image, an equivalent time sweep logic circuit configured to receive the pattern trigger signal and the end of row signals from the ring counter and to produce the clock signal with a delay to increment a clock delay to the ring counter until the fill complete signal is received, and a machine learning system configured to receive the
    Type: Application
    Filed: April 19, 2022
    Publication date: October 20, 2022
    Applicant: Tektronix, Inc.
    Inventors: John J. Pickerd, Kan Tan, Heike Tritschler, Evan Douglas Smith, Williams Fabricio Flores Yepez
  • Publication number: 20220311514
    Abstract: A test and measurement device has a connection to allow the test and measurement device to connect to an optical transceiver, one or more processors, configured to execute code that causes the one or more processors to: initially set operating parameters for the optical transceiver to average parameters, acquire a waveform from the optical transceiver, measure the acquired waveform and determine if operation of the transceiver passes or fails, send the waveform and the operating parameters to a machine learning system to obtain estimated parameters if the transceiver fails, adjust the operating parameters based upon the estimated parameters, and repeat the acquiring, measuring, sending, and adjusting as needed until the transceiver passes.
    Type: Application
    Filed: March 22, 2022
    Publication date: September 29, 2022
    Applicant: Tektronix, Inc.
    Inventors: Evan Douglas Smith, John J. Pickerd, Williams Fabricio Flores Yepez, Heike Tritschler
  • Publication number: 20220311513
    Abstract: A test and measurement system includes a test and measurement device, a connection to allow the test and measurement device to connect to an optical transceiver, and one or more processors, configured to execute code that causes the one or more processors to: set operating parameters for the optical transceiver to reference operating parameters; acquire a waveform from the optical transceiver; repeatedly execute the code to cause the one or more processors to set operating parameters and acquire a waveform, for each of a predetermined number of sets of reference operating parameters; build one or more tensors from the acquired waveforms; send the one or more tensors to a machine learning system to obtain a set of predicted operating parameters; set the operating parameters for the optical transceiver to the predicted operating parameters; and test the optical transceiver using the predicted operating parameters.
    Type: Application
    Filed: March 22, 2022
    Publication date: September 29, 2022
    Applicant: Tektronix, Inc.
    Inventors: John J. Pickerd, Kan Tan, Evan Douglas Smith, Heike Tritschler