Patents by Inventor Evan Robinson
Evan Robinson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11964310Abstract: A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.Type: GrantFiled: January 6, 2023Date of Patent: April 23, 2024Assignee: Bruker Nano, Inc.Inventors: Tod Evan Robinson, Bernabe Arruza, Kenneth Gilbert Roessler, David Brinkley, Jeffrey E. LeClaire
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Publication number: 20230328907Abstract: A bendable glass article having a bendable display unit is disclosed. The glass article includes a glass sheet including a first major surface and a second major surface opposite to the first major surface. A hinge mechanism is disposed on the second major surface of the glass sheet. The hinge mechanism divides the glass sheet into a first side and a second side. A bendable display unit is bonded to the second major surface of the glass sheet and disposed between the glass sheet and the hinge mechanism. An adhesive material is disposed on the second major surface of the glass sheet around the display. The first side is bendable about the hinge mechanism relative to the second side, and the bendable display unit is hermetically sealed within the adhesive material.Type: ApplicationFiled: August 10, 2021Publication date: October 12, 2023Inventors: Matthew Lee Black, Jordon Thomas Boggs, Matthew John Cempa, Kevin Thomas Gahagan, Evan Gray Kister, Balamurugan Meenakshi Sundaram, David Evan Robinson, Jason Scott Stewart
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Publication number: 20230278423Abstract: A glass article for a vehicle interior system (10). The glass article includes a glass sheet having first and second major surfaces with a minor surface connecting the first and second major surfaces. The glass sheet has a first side and a second side. A hinge is disposed on the second major surface of the glass sheet. The hinge divides the glass sheet between the first side and the second side. An encapsulating material is molded at least partially around the minor surface and at least partially over the second major surface. The second side of the glass sheet rotates about the hinge from a first configuration to a second configuration. In the first configuration, the first side forms a first angle with the second side, and in the second configuration, the first side forms a second angle, different from the first angle, with the second side.Type: ApplicationFiled: May 27, 2021Publication date: September 7, 2023Inventors: Evan Gray Kister, David Evan Robinson, Jason Scott Stewart
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Publication number: 20230236364Abstract: A system for maintaining relative orientation of optical fibers in an array is provided. Fibers extend parallel and include a first fiber and an adjacent fiber. The system includes a fiber holder with alignment holes configured to receive stripped fiber sections. The alignment holes extend from the first surface to the second surface, and the alignment holes include a first alignment hole configured to receive a stripped fiber section of the first fiber and an adjacent alignment hole configured to receive a stripped fiber section of the adjacent fiber. The fiber holder has a wall separating the first alignment hole and the adjacent alignment hole that permits rotation of the stripped fiber section of the adjacent fiber in the adjacent alignment hole without causing rotation of the stripped fiber section of the first fiber in the first alignment hole.Type: ApplicationFiled: January 24, 2023Publication date: July 27, 2023Inventors: Douglas Llewellyn Butler, Jeffrey Scott Clark, David Evan Robinson, James Scott Sutherland
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Publication number: 20230202300Abstract: Disclosed are structural design solutions for flexible display panels for use in automobile interiors that comprises a flexible joint portion that are configured to meet the requirements of the automobile industry standard head form impact testing.Type: ApplicationFiled: May 18, 2021Publication date: June 29, 2023Inventors: Amey Ganpat Badar, Kaikai Che, Joseph Paul Gelhaus, Paige Varner Kennedy, Evan Gray Kister, Khaled Layouni, Balamurugan Meenakshi Sundaram, Jong Se Park, Yousef Kayed Qaroush, David Evan Robinson, Jason Scott Stewart
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Publication number: 20230158555Abstract: A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.Type: ApplicationFiled: January 6, 2023Publication date: May 25, 2023Inventors: Tod Evan Robinson, Bernabe Arruza, Kenneth Gilbert Roessler, David Brinkley, Jeffrey E. LeClaire
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Patent number: 11577286Abstract: A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.Type: GrantFiled: June 15, 2021Date of Patent: February 14, 2023Assignee: Bruker Nano, Inc.Inventors: Tod Evan Robinson, Bernabe Arruza, Kenneth Gilbert Roessler, David Brinkley, Jeffrey E. LeClaire
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Patent number: 11391664Abstract: A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.Type: GrantFiled: May 17, 2019Date of Patent: July 19, 2022Assignee: Bruker Nano, Inc.Inventors: Tod Evan Robinson, Bernabe Arruza, Kenneth Gilbert Roessler, David Brinkley, Jeffrey E. LeClaire
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Publication number: 20210308724Abstract: A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.Type: ApplicationFiled: June 15, 2021Publication date: October 7, 2021Inventors: Tod Evan Robinson, Bernabe Arruza, Kenneth Gilbert Roessler, David Brinkley, Jeffrey E. LeClaire
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Patent number: 11040379Abstract: A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.Type: GrantFiled: July 19, 2019Date of Patent: June 22, 2021Assignee: Bruker Nano, Inc.Inventors: Tod Evan Robinson, Bernabe Arruza, Kenneth Gilbert Roessler, David Brinkley, Jeffrey E. LeClaire
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Publication number: 20210033620Abstract: This invention discloses a pretreatment approach for blood and bodily fluids to remove unwanted protein interferences in the measurement of analytes. Enzymes either contained in a cartridge or immobilized on a solid support break down proteins that complex with the analyte to shield it from detection. This pretreatment significantly enhances the detectability of analytes and does not require subsequent clean-up steps that would normally be required to ensure the functionality of the analysis method, thereby, creating a simple yet powerful approach for sample pretreatment in a variety of settings ranging from a complex laboratory infrastructure to a field deployable application.Type: ApplicationFiled: July 29, 2020Publication date: February 4, 2021Applicant: University of UtahInventors: Marc David Porter, Lars Bjorn Laurentius, Nicholas Owens, Ryan Evan Robinson
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Publication number: 20200180278Abstract: A glass laminate article having high efficiency heat transfer characteristics and related systems and methods are provided. The glass laminate article has a thin, high heat conductive inner glass layer that efficiently transfers heat from a heating system throughout the glass article. The glass laminate article may be used as a vehicle window and used as part of a heating system and method for defogging or defrosting the vehicle window. The glass laminate article may include a heating coating adjacent an outer glass layer which further improves heating efficiency.Type: ApplicationFiled: April 26, 2018Publication date: June 11, 2020Inventors: Vikram BHATIA, Ah-Young PARK, Yousef Kayed QAROUSH, David Evan ROBINSON
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Publication number: 20190337025Abstract: A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.Type: ApplicationFiled: July 19, 2019Publication date: November 7, 2019Inventors: Tod Evan Robinson, Bernabe Arruza, Kenneth Gilbert Roessler, David Brinkley, Jeffrey E. LeClaire
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Publication number: 20190271631Abstract: A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.Type: ApplicationFiled: May 17, 2019Publication date: September 5, 2019Inventors: Tod Evan Robinson, Bernabe Arruza, Kenneth Gilbert Roessler, David Brinkley, Jeffrey E. LeClaire
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Patent number: 10384238Abstract: A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.Type: GrantFiled: May 20, 2016Date of Patent: August 20, 2019Assignee: RAVE LLCInventors: Tod Evan Robinson, Bernabe J. Arruza, Kenneth Gilbert Roessler, David Brinkley, Jeffrey E. Leclaire
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Patent number: 10330581Abstract: A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.Type: GrantFiled: May 20, 2016Date of Patent: June 25, 2019Assignee: RAVE LLCInventors: Tod Evan Robinson, Bernabe J. Arruza, Kenneth Gilbert Roessler, David Brinkley, Jeffrey E. Leclaire
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Patent number: 10163140Abstract: An online merchants to third party warehouse providers broker and order fulfillment system is coupled with different third party warehouse providers that each operate one or more third party warehouses and a plurality of online merchants that use the services provided by the third party warehouse providers.Type: GrantFiled: April 10, 2009Date of Patent: December 25, 2018Assignee: Shipwire, Inc.Inventors: Evan Robinson, Damon Schechter
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Publication number: 20160263632Abstract: A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.Type: ApplicationFiled: May 20, 2016Publication date: September 15, 2016Inventors: TOD EVAN ROBINSON, BERNABE J. ARRUZA, KENNETH GILBERT ROESSLER, DAVID BRINKLEY, JEFFREY E. LECLAIRE
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Publication number: 20160266165Abstract: A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.Type: ApplicationFiled: May 20, 2016Publication date: September 15, 2016Inventors: TOD EVAN ROBINSON, BERNABE J. ARRUZA, KENNETH GILBERT ROESSLER, DAVID BRINKLEY, JEFFREY E. LECLAIRE
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Publication number: 20140176922Abstract: A system for removing debris from a surface of a photolithographic mask is provided. The system includes an atomic force microscope with a tip supported by a cantilever. The tip includes a surface and a nanometer-scaled coating disposed thereon. The coating has a surface energy lower than the surface energy of the photolithographic mask.Type: ApplicationFiled: February 28, 2014Publication date: June 26, 2014Inventors: Tod Evan Robinson, Bernabe J. Arruza, Kenneth Gilbert Roessler