Patents by Inventor Eveliina ARPONEN

Eveliina ARPONEN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11520058
    Abstract: The present invention provides a method for determining a background count rate in liquid scintillation counting. The method comprises measuring an external standard spectrum (201, 202) of a sample, determining, from the external standard spectrum, an external standard count rate within an energy window (203), determining, based on the external standard count rate within the energy window, a background reference parameter, and determining, based on the background reference parameter, the background count rate from a background reference curve (301).
    Type: Grant
    Filed: May 10, 2021
    Date of Patent: December 6, 2022
    Assignee: Hidex Oy
    Inventors: Petri Aronkyto, Eveliina Arponen, Ville Haaslahti, Risto Juvonen, Timo Oikari
  • Publication number: 20220326401
    Abstract: The present invention provides a method for determining a background count rate in liquid scintillation counting. The method comprises measuring external standard spectra of a sample, determining, from the external standard spectra, a triple to double coincidence ratio and a quench parameter, determining, based on the triple to double coincidence ratio and the quench parameter, a background reference parameter, and determining, based on the background reference parameter, the background count rate from a background reference curve.
    Type: Application
    Filed: March 16, 2022
    Publication date: October 13, 2022
    Inventors: Petri ARONKYTÖ, Eveliina ARPONEN, Ville HAASLAHTI, Risto JUVONEN, Timo OIKARI
  • Publication number: 20210389478
    Abstract: The present invention provides a method for determining a background count rate in liquid scintillation counting. The method comprises measuring an external standard spectrum (201, 202) of a sample, determining, from the external standard spectrum, an external standard count rate within an energy window (203), determining, based on the external standard count rate within the energy window, a background reference parameter, and determining, based on the background reference parameter, the background count rate from a background reference curve (301).
    Type: Application
    Filed: May 10, 2021
    Publication date: December 16, 2021
    Applicant: Hidex Oy
    Inventors: Petri ARONKYTO, Eveliina ARPONEN, Ville HAASLAHTI, Risto JUVONEN, Timo OIKARI