Patents by Inventor Evgeny Gregory Nisenboim

Evgeny Gregory Nisenboim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • TESTING A SEMICONDUCTOR DEVICE USING X-RAYS
    Publication number: 20240103072
    Abstract: Embodiments described herein may be related to apparatuses, processes, systems, and/or techniques for using x-rays to alter or observe circuits within a semiconductor device before, during or after a test of the semiconductor device. Other embodiments may be described and/or claimed.
    Type: Application
    Filed: September 23, 2022
    Publication date: March 28, 2024
    Inventors: Patrick PARDY, Kimberlee CELIO, Sanchari SEN, May Ling OH, Shuai ZHAO, Joshua W. KEVEK, Evgeny Gregory NISENBOIM, Amir RAVEH, Boris SIMKHOVICH, Charles A. PETERSON, Kevin JOHNSON, Martin Eric Gostasson VON HAARTMAN, Eli ABU AYOB, Xianghong TONG
  • Probe assembly with high bandwidth beam
    Patent number: 10163601
    Abstract: A probe assembly for analyzing a test device that includes a housing with an electron source disposed therein for emitting primary electrons. A photon source is positioned to emit photons that strike the electron source such that when the photons strike the electron source, the electron source emits the primary electrons. Detection circuitry is provided that is configured to detect secondary electrons emitted from a test device of a test assembly and to form an excitation waveform.
    Type: Grant
    Filed: December 28, 2017
    Date of Patent: December 25, 2018
    Assignee: Intel Corporation
    Inventors: Amir Raveh, Travis Eiles, Evgeny Gregory Nisenboim, Patrick Pardy