Abstract: The disclosure features mass spectrometry systems and methods that include an ion source, an ion trap, a detector subsystem featuring first and second detector elements, and a controller electrically connected to the ion source, the ion trap, and the detector subsystem and configured so that during operation of the system, the controller: applies an electrical signal to the ion source to generate positively and negatively charged particles from sample particles in the system; applies an electrical signal to the ion trap to eject a plurality of particles from the ion trap through a common aperture of the ion trap, and determines information about the sample particles based on first and second electrical signals generated by the ejected particles.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: The disclosure features mass spectrometry systems and methods that include an ion source, an ion trap, a detector subsystem featuring first and second detector elements, and a controller electrically connected to the ion source, the ion trap, and the detector subsystem and configured so that during operation of the system, the controller: applies an electrical signal to the ion source to generate positively and negatively charged particles from sample particles in the system; applies an electrical signal to the ion trap to eject a plurality of particles from the ion trap through a common aperture of the ion trap, and determines information about the sample particles based on first and second electrical signals generated by the ejected particles.

Abstract: The disclosure features mass spectrometry systems and methods that include an ion source, an ion trap, a detector subsystem featuring first and second detector elements, and a controller electrically connected to the ion source, the ion trap, and the detector subsystem and configured so that during operation of the system, the controller: applies an electrical signal to the ion source to generate positively and negatively charged particles from sample particles in the system; applies an electrical signal to the ion trap to eject a plurality of particles from the ion trap through a common aperture of the ion trap, and determines information about the sample particles based on first and second electrical signals generated by the ejected particles.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: The disclosure features mass spectrometry systems and methods that include an ion source, an ion trap, a detector subsystem featuring first and second detector elements, and a controller electrically connected to the ion source, the ion trap, and the detector subsystem and configured so that during operation of the system, the controller: applies an electrical signal to the ion source to generate positively and negatively charged particles from sample particles in the system; applies an electrical signal to the ion trap to eject a plurality of particles from the ion trap through a common aperture of the ion trap, and determines information about the sample particles based on first and second electrical signals generated by the ejected particles.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: A ion mobility-based analyzer system including a first ion mobility-based filter for passing selected ions through a time-varying field where the time-varying field being compensated by an adjustable compensation setting. The analyzer also includes a second ion mobility-based filter for receiving a first portion of ions from the first ion mobility-based filter. The second ion mobility-based filter includes a voltage gradient for separating ions of the first portion of ions where the ions have associated retention times based on their times of flight through the voltage gradient. The second ion mobility-based filter includes a detector for detecting the ions at their retention times. The analyzer system further includes a display that displays the detected ions in a plot relating the retention times of the ions in the second ion mobility-based filter with compensation settings of the first ion mobility-based filter.

Abstract: A sample analysis apparatus and system including an ion inlet, an ion detector and an ion focusing assembly for converging a plurality of ion streams from the ion inlet into at least one focused ion stream.

Abstract: The invention relates generally to ion mobility based systems, methods and devices for analyzing samples and, more particularly, to sample detection using multiple detection and analytical techniques in combination.

Abstract: A field asymmetric ion mobility spectrometer apparatus and system including a sample preparation and introduction section, a head for delivery of ions from a sample, an ion filtering section, an output part, and an electronics part wherein the filter section includes surfaces defining a flow path, further including ion filter electrodes facing each other over the flow path that enables the flow of ions derived from the sample between the electrodes and wherein the electronics part applies controlling signals to the electrodes for generating a filter field for filtering the flow of ions in the flow path while being compensated to pass desired ion species out of the filter.