Patents by Inventor Evgeny Krylov

Evgeny Krylov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10204775
    Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.
    Type: Grant
    Filed: April 15, 2016
    Date of Patent: February 12, 2019
    Assignee: 908 Devices Inc.
    Inventors: Christopher D. Brown, Glenn A. Harris, Evgeny Krylov, Scott Miller
  • Publication number: 20180247803
    Abstract: The disclosure features mass spectrometry systems and methods that include an ion source, an ion trap, a detector subsystem featuring first and second detector elements, and a controller electrically connected to the ion source, the ion trap, and the detector subsystem and configured so that during operation of the system, the controller: applies an electrical signal to the ion source to generate positively and negatively charged particles from sample particles in the system; applies an electrical signal to the ion trap to eject a plurality of particles from the ion trap through a common aperture of the ion trap, and determines information about the sample particles based on first and second electrical signals generated by the ejected particles.
    Type: Application
    Filed: February 23, 2018
    Publication date: August 30, 2018
    Inventors: Christopher D. Brown, Evgeny Krylov, Michael Goodwin, Kerin Gregory, Andrew J. Bartfay-Szabo
  • Patent number: 9905407
    Abstract: The disclosure features mass spectrometry systems and methods that include an ion source, an ion trap, a detector subsystem featuring first and second detector elements, and a controller electrically connected to the ion source, the ion trap, and the detector subsystem and configured so that during operation of the system, the controller: applies an electrical signal to the ion source to generate positively and negatively charged particles from sample particles in the system; applies an electrical signal to the ion trap to eject a plurality of particles from the ion trap through a common aperture of the ion trap, and determines information about the sample particles based on first and second electrical signals generated by the ejected particles.
    Type: Grant
    Filed: October 1, 2015
    Date of Patent: February 27, 2018
    Assignee: 908 Devices Inc.
    Inventors: Christopher D. Brown, Evgeny Krylov, Michael Goodwin, Kerin Gregory, Andrew J. Bartfay-Szabo
  • Publication number: 20170098534
    Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.
    Type: Application
    Filed: April 15, 2016
    Publication date: April 6, 2017
    Inventors: Christopher D. Brown, Glenn A. Harris, Evgeny Krylov, Scott Miller
  • Publication number: 20160099137
    Abstract: The disclosure features mass spectrometry systems and methods that include an ion source, an ion trap, a detector subsystem featuring first and second detector elements, and a controller electrically connected to the ion source, the ion trap, and the detector subsystem and configured so that during operation of the system, the controller: applies an electrical signal to the ion source to generate positively and negatively charged particles from sample particles in the system; applies an electrical signal to the ion trap to eject a plurality of particles from the ion trap through a common aperture of the ion trap, and determines information about the sample particles based on first and second electrical signals generated by the ejected particles.
    Type: Application
    Filed: October 1, 2015
    Publication date: April 7, 2016
    Inventors: Christopher D. Brown, Evgeny Krylov, Michael Goodwin, Kerin Gregory, Andrew J. Bartfay-Szabo
  • Publication number: 20160042936
    Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.
    Type: Application
    Filed: June 24, 2015
    Publication date: February 11, 2016
    Inventors: Christopher D. Brown, Kevin J. Knopp, Evgeny Krylov, Scott Miller
  • Publication number: 20150318161
    Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.
    Type: Application
    Filed: December 12, 2014
    Publication date: November 5, 2015
    Inventors: Christopher D. Brown, Glenn A. Harris, Evgeny Krylov, Scott Miller
  • Patent number: 9099286
    Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.
    Type: Grant
    Filed: December 31, 2012
    Date of Patent: August 4, 2015
    Assignee: 908 Devices Inc.
    Inventors: Christopher D. Brown, Kevin J. Knopp, Evgeny Krylov, Scott Miller
  • Patent number: 9093253
    Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.
    Type: Grant
    Filed: December 31, 2012
    Date of Patent: July 28, 2015
    Assignee: 908 Devices Inc.
    Inventors: Andrew J. Bartfay-Szabo, Christopher D. Brown, Michael Jobin, Kevin J. Knopp, Evgeny Krylov, Scott Miller
  • Patent number: 9006649
    Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.
    Type: Grant
    Filed: December 31, 2012
    Date of Patent: April 14, 2015
    Assignee: 908 Devices Inc.
    Inventors: Andrew J. Bartfay-Szabo, Christopher D. Brown, Michael Jobin, Kevin J. Knopp, Evgeny Krylov, Scott Miller
  • Patent number: 8921774
    Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.
    Type: Grant
    Filed: May 2, 2014
    Date of Patent: December 30, 2014
    Assignee: 908 Devices Inc.
    Inventors: Christopher D. Brown, Glenn A. Harris, Evgeny Krylov, Scott Miller
  • Patent number: 8816272
    Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.
    Type: Grant
    Filed: May 2, 2014
    Date of Patent: August 26, 2014
    Assignee: 908 Devices Inc.
    Inventors: Christopher D. Brown, Glenn A. Harris, Evgeny Krylov, Scott Miller
  • Publication number: 20140183350
    Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.
    Type: Application
    Filed: December 31, 2012
    Publication date: July 3, 2014
    Applicant: 908 DEVICES INC.
    Inventors: Christopher D. Brown, Kevin J. Knopp, Evgeny Krylov, Scott Miller
  • Publication number: 20140183355
    Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.
    Type: Application
    Filed: December 31, 2012
    Publication date: July 3, 2014
    Applicant: 908 DEVICES INC.
    Inventors: Andrew J. Bartfay-Szabo, Christopher D. Brown, Michael Jobin, Kevin J. Knopp, Evgeny Krylov, Scott Miller
  • Patent number: 8525111
    Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.
    Type: Grant
    Filed: December 31, 2012
    Date of Patent: September 3, 2013
    Assignee: 908 Devices Inc.
    Inventors: Christopher D. Brown, Michael Jobin, Kevin J. Knopp, Evgeny Krylov, Scott Miller
  • Publication number: 20120025070
    Abstract: A ion mobility-based analyzer system including a first ion mobility-based filter for passing selected ions through a time-varying field where the time-varying field being compensated by an adjustable compensation setting. The analyzer also includes a second ion mobility-based filter for receiving a first portion of ions from the first ion mobility-based filter. The second ion mobility-based filter includes a voltage gradient for separating ions of the first portion of ions where the ions have associated retention times based on their times of flight through the voltage gradient. The second ion mobility-based filter includes a detector for detecting the ions at their retention times. The analyzer system further includes a display that displays the detected ions in a plot relating the retention times of the ions in the second ion mobility-based filter with compensation settings of the first ion mobility-based filter.
    Type: Application
    Filed: August 8, 2011
    Publication date: February 2, 2012
    Applicant: DH Technologies Development PTE. Ltd.
    Inventors: Raanan A. Miller, Evgeny Krylov, Erkinjon G. Nazarov, Gary A. Eiceman, John A. Wright
  • Publication number: 20110101214
    Abstract: A sample analysis apparatus and system including an ion inlet, an ion detector and an ion focusing assembly for converging a plurality of ion streams from the ion inlet into at least one focused ion stream.
    Type: Application
    Filed: August 13, 2010
    Publication date: May 5, 2011
    Inventors: Raanan A. Miller, Erkinjon G. Nazarov, C. James Morris, Stephen Coy, Evgeny Krylov, D. Westervelt Davis
  • Patent number: 7714284
    Abstract: The invention relates generally to ion mobility based systems, methods and devices for analyzing samples and, more particularly, to sample detection using multiple detection and analytical techniques in combination.
    Type: Grant
    Filed: January 13, 2005
    Date of Patent: May 11, 2010
    Assignee: Sionex Corporation
    Inventors: Raanan A. Miller, Erkinjon G. Nazarov, Lawrence A. Kaufman, Evgeny Krylov, Gary A. Eiceman
  • Patent number: 7462825
    Abstract: A field asymmetric ion mobility spectrometer apparatus and system including a sample preparation and introduction section, a head for delivery of ions from a sample, an ion filtering section, an output part, and an electronics part wherein the filter section includes surfaces defining a flow path, further including ion filter electrodes facing each other over the flow path that enables the flow of ions derived from the sample between the electrodes and wherein the electronics part applies controlling signals to the electrodes for generating a filter field for filtering the flow of ions in the flow path while being compensated to pass desired ion species out of the filter.
    Type: Grant
    Filed: May 18, 2006
    Date of Patent: December 9, 2008
    Assignee: The Charles Stark Draper Laboratory, Inc.
    Inventors: Raanan A. Miller, Erkinjon G. Nazarov, Gary A. Eiceman, Evgeny Krylov
  • Publication number: 20080185512
    Abstract: A ion mobility-based analyzer system including a first ion mobility-based filter for passing selected ions through a time-varying field where the time-varying field being compensated by an adjustable compensation setting. The analyzer also includes a second ion mobility-based filter for receiving a first portion of ions from the first ion mobility-based filter. The second ion mobility-based filter includes a voltage gradient for separating ions of the first portion of ions where the ions have associated retention times based on their times of flight through the voltage gradient. The second ion mobility-based filter includes a detector for detecting the ions at their retention times. The analyzer system further includes a display that displays the detected ions in a plot relating the retention times of the ions in the second ion mobility-based filter with compensation settings of the first ion mobility-based filter.
    Type: Application
    Filed: April 1, 2008
    Publication date: August 7, 2008
    Applicant: SIONEX CORPORATION
    Inventors: Raanan A. Miller, Evgeny Krylov, Erkinjon G. Nazarov, Gary A. Eiceman, John A. Wright