Patents by Inventor Ewelina N. Lucow

Ewelina N. Lucow has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9263611
    Abstract: A single-step wet etch process is provided to isolate multijunction solar cells on semiconductor substrates, wherein the wet etch chemistry removes semiconductor materials nonselectively without a major difference in etch rate between different heteroepitaxial layers. The solar cells thus formed comprise multiple heterogeneous semiconductor layers epitaxially grown on the semiconductor substrate.
    Type: Grant
    Filed: November 16, 2012
    Date of Patent: February 16, 2016
    Assignee: Solar Junction Corporation
    Inventors: Onur Fidaner, Michael West Wiemer, Vijit A. Sabnis, Ewelina N. Lucow
  • Patent number: 8912617
    Abstract: A semiconductor light detection device fabrication technique is provided in which the cap etch and anti-reflection coating steps are performed in a single, self-aligned lithography module.
    Type: Grant
    Filed: October 27, 2011
    Date of Patent: December 16, 2014
    Assignee: Solar Junction Corporation
    Inventors: Lan Zhang, Ewelina N. Lucow, Onur Fidaner, Michael W. Wiemer
  • Publication number: 20130312817
    Abstract: A single-step wet etch process is provided to isolate multijunction solar cells on semiconductor substrates, wherein the wet etch chemistry removes semiconductor materials nonselectively without a major difference in etch rate between different heteroepitaxial layers. The solar cells thus formed comprise multiple heterogeneous semiconductor layers epitaxially grown on the semiconductor substrate.
    Type: Application
    Filed: November 16, 2012
    Publication date: November 28, 2013
    Applicant: Solar Junction Corporation
    Inventors: Onur Fidaner, Michael West Wiemer, Vijit A. Sabnis, Ewelina N. Lucow
  • Publication number: 20130105930
    Abstract: A semiconductor light detection device fabrication technique is provided in which the cap etch and anti-reflection coating steps are performed in a single, self-aligned lithography module.
    Type: Application
    Filed: October 27, 2011
    Publication date: May 2, 2013
    Applicant: Solar Junction Corporation
    Inventors: Lan Zhang, Ewelina N. Lucow, Onur Fidaner, Michael W. Wiemer