Patents by Inventor Eyal En Gad

Eyal En Gad has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240095123
    Abstract: A method includes determining a quantity of errors for a bit string based on a quantity of bits having a logical value of one within the bit string and writing an indication corresponding to the quantity of errors for the bit string to an array of memory cells. The method can further include determining that the quantity of errors for the bit string has reached a threshold quantity of errors and refraining from performing a subsequent operation to determine the quantity of errors for the bit string in response to determining that the quantity of errors for the bit string has reached the threshold quantity of errors.
    Type: Application
    Filed: September 21, 2022
    Publication date: March 21, 2024
    Inventors: Leon Zlotnik, Eyal En Gad, Fan Zhou
  • Publication number: 20240097707
    Abstract: A decoding operation is performed by altering at least one bit of the bit string from a first value to a second value and applying a bit mask to each bit of the bit string that is not altered from the first value to the second value. The decoding operation further includes writing an indication corresponding to a quantity of bits that have been altered from the first value to the second value to an array of memory cells, wherein the indication corresponds to a quantity of errors contained in the bit string, determining that the quantity of errors for the bit string has reached a threshold quantity of errors, and refraining from performing a subsequent operation to alter at least the one bit of the bit string, or a different bit of the bit string, or both, from the first value to the second value in response to determining that the quantity of errors for the bit string has reached the threshold quantity of errors.
    Type: Application
    Filed: September 21, 2022
    Publication date: March 21, 2024
    Inventors: Leon Zlotnik, Eyal En Gad
  • Publication number: 20230396269
    Abstract: A processing device in a memory sub-system reads a sense word from a memory device and executes a plurality of parity check equations on corresponding subsets of the sense word to determine a plurality of parity check equation results. The processing device further determines a syndrome for the sense word using the plurality of parity check equation results and determines whether the syndrome for the sense word satisfies a codeword criterion. Responsive to the syndrome for the sense word not satisfying the codeword criterion, the processing device performs an iterative low density parity check (LDPC) correction process using a scaled bit flip threshold to correct one or more errors in the sense word.
    Type: Application
    Filed: June 1, 2022
    Publication date: December 7, 2023
    Inventors: Eyal En Gad, Mustafa N. Kaynak, Sivagnanam Parthasarathy, Yoav Weinberg
  • Publication number: 20230393765
    Abstract: A processing device in a memory sub-system receives a request to perform a memory access operation on a memory device, determines a memory segment identifier associated with the memory access operation, and applies a hash function to the memory segment identifier to generate a hashed seed. The processing device further provides the hashed seed to a pseudo-random number generator to generate a randomized string, and performs the memory access operation on the memory device using the randomized string.
    Type: Application
    Filed: June 1, 2022
    Publication date: December 7, 2023
    Inventors: Eyal En Gad, Zhengang Chen, Yoav Weinberg
  • Publication number: 20230396271
    Abstract: A processing device in a memory sub-system determines a syndrome weight for a sense word read from a memory device and determines whether the syndrome weight for the sense word satisfies a threshold criterion. Responsive to the syndrome weight for the sense word satisfying a respective threshold criterion associated with a next iteration of a first decoding operation, bypassing the first decoding operation and initiating a second decoding operation for the sense word, wherein the second decoding operation has a higher error correction capability than the first decoding operation.
    Type: Application
    Filed: June 1, 2022
    Publication date: December 7, 2023
    Inventors: Eyal En Gad, Mustafa N. Kaynak, Yoav Weinberg, Zhengang Chen, Sivagnanam Parthasarathy
  • Patent number: 11777522
    Abstract: Methods, systems, and apparatuses include receiving a codeword stored in a memory device. Syndrome information and energy function values are determined for bits of the codeword. A bit flipping criterion is selected using the syndrome information from a plurality of values. A bit of the codeword is flipped when the energy function values for a bit of the codeword satisfies the bit flipping criterion. A corrected codeword that results from the flipping of the bits is returned.
    Type: Grant
    Filed: March 28, 2022
    Date of Patent: October 3, 2023
    Assignee: MICRON TECHNOLOGY, INC.
    Inventors: Mustafa N. Kaynak, Sivagnanam Parthasarathy, Eyal En Gad
  • Publication number: 20230308114
    Abstract: Methods, systems, and apparatuses include receiving a codeword stored in a memory device. Syndrome information and energy function values are determined for bits of the codeword. A bit flipping criterion is selected using the syndrome information from a plurality of values. A bit of the codeword is flipped when the energy function values for a bit of the codeword satisfies the bit flipping criterion. A corrected codeword that results from the flipping of the bits is returned.
    Type: Application
    Filed: March 28, 2022
    Publication date: September 28, 2023
    Inventors: Mustafa N. Kaynak, Sivagnanam Parthasarathy, Eyal En Gad
  • Patent number: 11750218
    Abstract: A processing device in a memory system reads a sense word from a memory device and executes a plurality of parity check equations on corresponding subsets of the sense word to determine a plurality of parity check equation results. The processing device determines a syndrome for the sense word using the plurality of parity check equation results, determines whether the syndrome for the sense word satisfies a codeword criterion, and responsive to the syndrome for the sense word not satisfying the codeword criterion, performs an iterative low density parity check (LDPC) correction process, wherein at least one criterion of the iterative LDPC correction process is adjusted after a threshold number of iterations is performed.
    Type: Grant
    Filed: June 2, 2022
    Date of Patent: September 5, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Eyal En Gad, Zhengang Chen, Sivagnanam Parthasarathy, Yoav Weinberg
  • Publication number: 20230195358
    Abstract: A memory device having a bit-flipping decoder. The decoder having a plurality of circuits operatable to perform parallel computation to decode a codeword according to a plurality of columns of a parity matrix. The decoder is configured to provide columns of the parity matrix for processing in the plurality of circuits in an order where columns processed concurrently by the plurality of circuits in pipeline stages include no more than one parity column of the parity matrix.
    Type: Application
    Filed: December 20, 2021
    Publication date: June 22, 2023
    Inventors: Eyal En Gad, Mustafa N. Kaynak, Sivagnanam Parthasarathy, Yoav Weinberg
  • Patent number: 11632132
    Abstract: A processing device in a memory system receives a request to read data from a memory device. In response to receiving the request, the processing device performs an iterative error correction process on the data, wherein at least one iteration after a first iteration in the error correction process uses a criterion that is based at least partially on a previous iteration or partial iteration, and wherein performing the iterative error correction process comprises flipping any bits in the data having an associated number of unsatisfied parity check equations that satisfies a threshold criterion associated with the previous iteration.
    Type: Grant
    Filed: September 16, 2021
    Date of Patent: April 18, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Eyal En Gad, Zhengang Chen, Sivagnanam Parthasarathy, Yoav Weinberg
  • Patent number: 11551772
    Abstract: A set of bits of a segment of a memory device that is associated with an unsuccessful first decoding operation can be identified. A discrepancy value for at least one bit of the set of bits can be calculated. It can be determined whether the discrepancy value calculated for the at least one bit of the set of bits corresponds to a correction capability of the failed decoding operation. In response to determining that the discrepancy value calculated for the at least one bit corresponds to the correction capability of the failed decoding operation, the at least one bit of the set of bits can be corrected by switching a value of the at least one bit.
    Type: Grant
    Filed: February 4, 2021
    Date of Patent: January 10, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Yingquan Wu, Eyal En Gad
  • Publication number: 20220294473
    Abstract: A processing device in a memory system reads a sense word from a memory device and executes a plurality of parity check equations on corresponding subsets of the sense word to determine a plurality of parity check equation results. The processing device determines a syndrome for the sense word using the plurality of parity check equation results, determines whether the syndrome for the sense word satisfies a codeword criterion, and responsive to the syndrome for the sense word not satisfying the codeword criterion, performs an iterative low density parity check (LDPC) correction process, wherein at least one criterion of the iterative LDPC correction process is adjusted after a threshold number of iterations is performed.
    Type: Application
    Filed: June 2, 2022
    Publication date: September 15, 2022
    Inventors: Eyal En Gad, Zhengang Chen, Sivagnanam Parthasarathy, Yoav Weinberg
  • Patent number: 11394403
    Abstract: Methods and system for error correction based on rate adaptive LDPC codes with flexible column weights in the parity check matrices are described. Data is encoded according to a first encoding parity check matrix of a first Low Density Parity Check (LDPC) code to obtain a first codeword with first parities. The first codeword is encoded according to a second encoding parity check matrix of a second LDPC code to obtain second parities. The first codeword is received. Responsive to failure of error correction of the first codeword based on the first parities, the second parities are received. The first codeword is corrected based on the second parities and a decoding parity check matrix of a rate adaptive LDPC code that is constructed by vertically concatenating the second encoding parity check matrix and the first encoding parity check matrix and adding an all-zero sub-matrix to complete its dimensions.
    Type: Grant
    Filed: August 23, 2021
    Date of Patent: July 19, 2022
    Assignee: MICRON TECHNOLOGY, INC.
    Inventors: Eyal En Gad, Sivagnanam Parthasarathy, Zhengang Chen, Mustafa N. Kaynak, Yoav Weinberg
  • Patent number: 11374592
    Abstract: A processing device in a memory system reads a sense word from a memory device and executes a plurality of parity check equations on corresponding subsets of the sense word to determine a plurality of parity check equation results. The processing device determines a syndrome for the sense word using the plurality of parity check equation results, determines whether the syndrome for the sense word satisfies a codeword criterion, and responsive to the syndrome for the sense word not satisfying the codeword criterion, performs an iterative low density parity check (LDPC) correction process, wherein at least one criterion of the iterative LDPC correction process is adjusted after a threshold number of iterations is performed.
    Type: Grant
    Filed: March 2, 2020
    Date of Patent: June 28, 2022
    Assignee: MICRON TECHNOLOGY, INC.
    Inventors: Eyal En Gad, Zhengang Chen, Sivagnanam Parthasarathy, Yoav Weinberg
  • Publication number: 20220006473
    Abstract: A processing device in a memory system receives a request to read data from a memory device. In response to receiving the request, the processing device performs an iterative error correction process on the data, wherein at least one iteration after a first iteration in the error correction process uses a criterion that is based at least partially on a previous iteration or partial iteration, and wherein performing the iterative error correction process comprises flipping any bits in the data having an associated number of unsatisfied parity check equations that satisfies a threshold criterion associated with the previous iteration.
    Type: Application
    Filed: September 16, 2021
    Publication date: January 6, 2022
    Inventors: Eyal En Gad, Zhengang Chen, Sivagnanam Parthasarathy, Yoav Weinberg
  • Patent number: 11146291
    Abstract: A processing device in a memory system reads a sense word from a memory device and executes a plurality of parity check equations on corresponding subsets of the sense word to determine a plurality of parity check equation results. The processing device determines a syndrome for the sense word using the plurality of parity check equation results, determines whether the syndrome for the sense word satisfies a codeword criterion, and responsive to the syndrome for the sense word not satisfying the codeword criterion, performs an iterative LDPC correction process, wherein at least one iteration after a first iteration in the LDPC correction process uses a criterion based at least partially on a previous iteration or partial iteration.
    Type: Grant
    Filed: March 2, 2020
    Date of Patent: October 12, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Eyal En Gad, Zhengang Chen, Sivagnanam Parthasarathy, Yoav Weinberg
  • Publication number: 20210273653
    Abstract: A processing device in a memory system reads a sense word from a memory device and executes a plurality of parity check equations on corresponding subsets of the sense word to determine a plurality of parity check equation results. The processing device determines a syndrome for the sense word using the plurality of parity check equation results, determines whether the syndrome for the sense word satisfies a codeword criterion, and responsive to the syndrome for the sense word not satisfying the codeword criterion, performs an iterative low density parity check (LDPC) correction process, wherein at least one criterion of the iterative LDPC correction process is adjusted after a threshold number of iterations is performed.
    Type: Application
    Filed: March 2, 2020
    Publication date: September 2, 2021
    Inventors: Eyal En Gad, Zhengang Chen, Sivagnanam Parthasarathy, Yoav Weinberg
  • Publication number: 20210273652
    Abstract: A processing device in a memory system reads a sense word from a memory device and executes a plurality of parity check equations on corresponding subsets of the sense word to determine a plurality of parity check equation results. The processing device determines a syndrome for the sense word using the plurality of parity check equation results, determines whether the syndrome for the sense word satisfies a codeword criterion, and responsive to the syndrome for the sense word not satisfying the codeword criterion, performs an iterative LDPC correction process, wherein at least one iteration after a first iteration in the LDPC correction process uses a criterion based at least partially on a previous iteration or partial iteration.
    Type: Application
    Filed: March 2, 2020
    Publication date: September 2, 2021
    Inventors: Eyal En Gad, Zhengang Chen, Sivagnanam Parthasarathy, Yoav Weinberg
  • Publication number: 20210159922
    Abstract: A set of bits of a segment of a memory device that is associated with an unsuccessful first decoding operation can be identified. A discrepancy value for at least one bit of the set of bits can be calculated. It can be determined whether the discrepancy value calculated for the at least one bit of the set of bits corresponds to a correction capability of the failed decoding operation. In response to determining that the discrepancy value calculated for the at least one bit corresponds to the correction capability of the failed decoding operation, the at least one bit of the set of bits can be corrected by switching a value of the at least one bit.
    Type: Application
    Filed: February 4, 2021
    Publication date: May 27, 2021
    Inventors: Yingquan Wu, Eyal En Gad
  • Patent number: 10951239
    Abstract: A set of bits of a data block that is associated with an unsuccessful first decoding operation may be identified. A second decoding operation to simulate switching at least one bit of the set of bits may be performed. At least one bit of the set of bits switched during the performance of the second decoding operation may be determined to correspond to an error. The error from the at least one bit of the set of bits may be corrected by changing a value of the at least one bit.
    Type: Grant
    Filed: February 20, 2018
    Date of Patent: March 16, 2021
    Assignee: MICRON TECHNOLOGY, INC.
    Inventors: Yingquan Wu, Eyal En Gad