Patents by Inventor Eyal Klingbell

Eyal Klingbell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8291066
    Abstract: The invention provides a method for learning and identification of message types in a network in which the learning and identification is based solely upon information contained in messages in the network. In one embodiment, the method includes comparing a current message with one or more previously defined message structures and applying a comparison method in order to infer whether the structure of the current message conforms to any one of the previously defined message structures. The invention also provides a method for classifying a collection of messages input or output from a computational node in which the set of messages is portioned into subsets of similar messages, and a structure of the messages of each subset is characterized. The invention further provides a method for inferring causal relations between a message type input to a computational node in a network and message type output from the computational node in the network using one or more statistical tests.
    Type: Grant
    Filed: February 20, 2007
    Date of Patent: October 16, 2012
    Assignee: Trading Systems Associates (TS-A) (Israel) Limited
    Inventors: Shawn Melamed, Amir Knipel, Einat Or, Eyal Klingbell
  • Patent number: 7388978
    Abstract: An electrical circuit inspection method including, for each of a plurality of types of local characteristics, each type occurring at least once within electrical circuitry to be inspected, identifying at least one portion of interest within the electrical circuitry whereat the local characteristic is expected to occur, and inspecting an image of each portion of interest, using an inspection task selected in response to the type of local characteristic expected to occur in the portion of interest.
    Type: Grant
    Filed: November 12, 2003
    Date of Patent: June 17, 2008
    Assignee: Orbotech Ltd.
    Inventors: Sharon Duvdevani, Tally Gilat-Bernshtein, Eyal Klingbell, Meir Mayo, Shmuel Rippa, Zeev Smilansky
  • Publication number: 20070206633
    Abstract: The invention provides a method for learning and identification of message types in a network in which the learning and identification is based solely upon information contained in messages in the network. In one embodiment, the method includes comparing a current message with one or more previously defined message structures and applying a comparison method in order to infer whether the structure of the current message conforms to any one of the previously defined message structures. The invention also provides a method for classifying a collection of messages input or output from a computational node in which the set of messages is portioned into subsets of similar messages, and a structure of the messages of each subset is characterized. The invention further provides a method for inferring causal relations between a message type input to a computational node in a network and message type output from the computational node in the network using one or more statistical tests.
    Type: Application
    Filed: February 20, 2007
    Publication date: September 6, 2007
    Inventors: Shawn Melamed, Amir Knipel, Einat Or, Eyal Klingbell
  • Patent number: 7206443
    Abstract: A method for inspecting objects comprising: creating a reference image for a representative object, the reference image comprising an at least partially vectorized first representation of boundaries representing the representative object; acquiring an image of an object under inspection comprising a second representation of boundaries representing the object under inspection; and comparing a location of at least some boundaries in the second representation of boundaries to a location of corresponding boundaries in the at least partially vectorized first representation of boundaries, thereby to identify defects.
    Type: Grant
    Filed: August 7, 2000
    Date of Patent: April 17, 2007
    Assignee: Orbotech Ltd.
    Inventors: Sharon Duvdevani, Tally Gilat-Bernshtein, Eyal Klingbell, Meir Mayo, Shmuel Rippa, Zeev Smilansky
  • Patent number: 7181059
    Abstract: A method for inspecting electrical circuits, and a system for carrying out the method, generating a representation of boundaries of elements in an image of an electrical circuit which is under inspection, and analyzing at least some locations of at least some boundaries in the representation of boundaries of elements to identify defects in the electrical circuit.
    Type: Grant
    Filed: November 12, 2003
    Date of Patent: February 20, 2007
    Assignee: Orbotech Ltd.
    Inventors: Sharon Duvdevani, Tally Gilat-Bernshtein, Eyal Klingbell, Meir Mayo, Shmuel Rippa, Zeev Smilansky
  • Publication number: 20040126005
    Abstract: This invention discloses a system and method for inspecting objects, the method including creating a reference image for a representative object, the reference image comprising an at least partially vectorized first representation of boundaries within the image, acquiring an image of an object under inspection comprising a second representation of boundaries within the image, and comparing the second representation of boundaries to said at least partially vectorized first representation of boundaries, thereby to identify defects.
    Type: Application
    Filed: November 12, 2003
    Publication date: July 1, 2004
    Applicant: ORBOTECH LTD.
    Inventors: Sharon Duvdevani, Tally Gilat-Bernshtein, Eyal Klingbell, Meir Mayo, Shmuel Rippa, Zeev Smilansky
  • Publication number: 20040120571
    Abstract: This invention discloses a system and method for inspecting objects, the method including creating a reference image for a representative object, the reference image comprising an at least partially vectorized first representation of boundaries within the image, acquiring an image of an object under inspection comprising a second representation of boundaries within the image, and comparing the second representation of boundaries to said at least partially vectorized first representation of boundaries, thereby to identify defects.
    Type: Application
    Filed: November 12, 2003
    Publication date: June 24, 2004
    Applicant: ORBOTECH LTD.
    Inventors: Sharon Duvdevani, Tally Gilat-Bernshtein, Eyal Klingbell, Meir Mayo, Shmuel Rippa, Zeev Smilansky