Abstract: There is provided a system and method of defect detection of a semiconductor specimen. The method includes obtaining a first image of the specimen acquired at a first bit depth, converting by a first processor the first image to a second image with a second bit depth lower than the first bit depth, transmitting the second image to a second processor configured to perform first defect detection on the second image using a first defect detection algorithm to obtain a first set of defect candidates, and sending locations of the first set of defect candidates to the first processor, extracting, from the first image, a set of image patches corresponding to the first set of defect candidates based on the locations, and performing second defect detection on the set of image patches using a second defect detection algorithm to obtain a second set of defect candidates.

Abstract: A system, method, and computer program product are provided for performing operations on network files including captured billing event information. In use, at least one network file is generated in response to a data capture command associated with a communications network, the at least one network file including information associated with a plurality of billing events corresponding to the communication network. Additionally, user input is received to perform at least one operation corresponding to the at least one network file, the at least one operation including at least one of: editing the at least one network file; filtering the at least one network file, based on configurable criteria; replaying at least a portion of the plurality of billing events included in the at least one network file; and generating an event template utilizing at least a portion of the information associated with the plurality of billing events.