Abstract: A semiconductor metrology system including a spectrum acquisition tool for collecting, using a first measurement protocol, baseline scatterometric spectra on first semiconductor wafer targets, and for various sources of spectral variability, variability sets of scatterometric spectra on second semiconductor wafer targets, the variability sets embodying the spectral variability, a reference metrology tool for collecting, using a second measurement protocol, parameter values of the first semiconductor wafer targets, and a training unit for training, using the collected spectra and values, a prediction model using machine learning and minimizing an associated loss function incorporating spectral variability terms, the prediction model for predicting values for production semiconductor wafer targets based on their spectra.

Abstract: The invention relates to systems, methods, network devices, and machine-readable media for encoding an input message with robustness against noise by executing a compressing hash function on the input message, encoding an output of the hash function and the input message to generate a single combined message, executing a permutation function on the combined message, and encoding the result of the permutation function with a list-decodable code.

Abstract: A recommender system that represents items in a catalog by first feature vectors in a first vector space based on first characteristics of the items and second feature vectors in a second vector space based on second characteristics of the items different from the first characteristics and maps a feature vector defined in the first vector space for an item to a vector in the second vector space to provide recommendations based on the item.

Abstract: A recommender system that represents items in a catalog by first feature vectors in a first vector space based on first characteristics of the items and second feature vectors in a second vector space based on second characteristics of the items different from the first characteristics and maps a feature vector defined in the first vector space for an item to a vector in the second vector space to provide recommendations based on the item.

Abstract: Embodiments of the invention provide methods and apparatus for recommending items from a catalog of items to users in a population of users by generating trait vectors that represent items in the catalog responsive to explicit and/or implicit preference data for a group of less than all the users and using the trait vectors to recommend items to users in the population that are not in the group.