Abstract: A method and apparatus for measuring an unknown impedance. The apparatus comprises a first input to receive a first signal generated by a first portion of a sensor circuit, the first portion comprising an unknown impedance and a first known resistance, the unknown impedance to vary based upon a phenomenon to be measured by the sensor circuit. The apparatus also comprises a second input to receive a second signal generated by a second portion of the sensor circuit, the second portion of the sensor circuit comprising a known impedance and a second known resistance. And the apparatus comprises control logic to, based on a difference in time at which each of the first input and the second input reach a reference voltage, determine a measurement of the sensor circuit.

Abstract: A method and apparatus for measuring an unknown impedance. The apparatus comprises a first input to receive a first signal generated by a first portion of a sensor circuit, the first portion comprising an unknown impedance and a first known resistance, the unknown impedance to vary based upon a phenomenon to be measured by the sensor circuit. The apparatus also comprises a second input to receive a second signal generated by a second portion of the sensor circuit, the second portion of the sensor circuit comprising a known impedance and a second known resistance. And the apparatus comprises control logic to, based on a difference in time at which each of the first input and the second input reach a reference voltage, determine a measurement of the sensor circuit.

Abstract: A system includes a conditioning circuit, resistors connected to pins of the conditioning circuit, and measurement sensors connected to pins of the conditioning circuit. The conditioning circuit is configured to determine resistance values of the resistors and to determine a set of addresses for the measurement sensors based upon a combination of the resistance values of the resistors.

Abstract: A system includes a conditioning circuit, resistors connected to pins of the conditioning circuit, and measurement sensors connected to pins of the conditioning circuit. The conditioning circuit is configured to determine resistance values of the resistors and to determine a set of addresses for the measurement sensors based upon a combination of the resistance values of the resistors.

Abstract: An integrated temperature sensor device has a temperature sensor providing an analog signal corresponding to an ambient temperature, an analog-to-digital converter coupled to the sensor conditioning circuit and receiving the analog temperature signal, and a timer and control circuit which is operable to be configured to control the temperature sensor device to perform a sequence of temperature measurements and shut-down time periods, wherein multiple temperature measurements are taken during the measurement period, wherein the timer and control circuit is further operable to be programmed to set the number of temperature measurements and the length of the shut-down period.

Abstract: An integrated temperature sensor device has a temperature sensor providing an analog signal corresponding to an ambient temperature, an analog-to-digital converter coupled to the sensor conditioning circuit and receiving the analog temperature signal, and a timer and control circuit which is operable to be configured to control the temperature sensor device to perform a sequence of temperature measurements and shut-down time periods, wherein multiple temperature measurements are taken during the measurement period, wherein the timer and control circuit is further operable to be programmed to set the number of temperature measurements and the length of the shut-down period.

Abstract: A plurality of devices under test (DUT) are arranged in a strip tester having a temperature controlled heater block. Each DUT has a respective set of electrical test probes and a thermally conductive test probe for electrically and thermally coupling, respectively, of the strip tester to the DUTs. Temperature measurement of each of the plurality of DUTs is performed by a temperature measuring device. The temperature measuring device can be part of the test board of the strip tester and will be in thermal communications with the DUT through the thermally conductive test probe, or temperature of the DUT can be measurement with an RTD embedded in the thermally conductive test probe, thereby providing faster thermal response time.

Abstract: A plurality of devices under test (DUT) are arranged in a strip tester having a temperature controlled heater block. Each DUT has a respective set of electrical test probes and a thermally conductive test probe for electrically and thermally coupling, respectively, of the strip tester to the DUTs. Temperature measurement of each of the plurality of DUTs is performed by a temperature measuring device. The temperature measuring device can be part of the test board of the strip tester and will be in thermal communications with the DUT through the thermally conductive test probe, or temperature of the DUT can be measurement with an RTD embedded in the thermally conductive test probe, thereby providing faster thermal response time.