Patents by Inventor Fabian Kederer

Fabian Kederer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device for providing symetrical monitoring of ESD testing an integrated circuit
    Patent number: 6469536
    Abstract: A method and a device (4) for testing an integrated circuit (DUT) uses a stress signal and surface monitoring. A stress signal generator (5) is connected to the integrated circuit (DUT) to apply the stress signal (v(t)) to the integrated circuit. A failure is observed in real time by monitoring the surface (6) of the integrated circuit (DUT) during a monitoring time window (&Dgr;T) by an emission microscope (10) having a controllable shutter (15). The time window has a predetermined relation with respect to the duration of the stress signal.
    Type: Grant
    Filed: October 17, 2000
    Date of Patent: October 22, 2002
    Assignee: Motorola, Inc.
    Inventors: Thomas Kessler, Andreas Tausch, Fabian Kederer