Patents by Inventor Fabiano Pandozzi

Fabiano Pandozzi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Quantification of an absorber through a scattering medium
    Patent number: 8384033
    Abstract: There is described a method for determining a quantitative parameter of a compound in an analysis sample, comprising: providing a scattering medium in physical contact with the analysis sample, the scattering medium having at least one layer, an index of refraction of the scattering medium being superior to an index of refraction of the analysis sample; propagating, in the scattering medium, an incident beam of light having a wavelength substantially corresponding to an absorption wavelength of the compound such that an evanescent wave is generated at an interface between the scattering medium and the analysis sample; taking n intensity measurements of a reflected beam of light for the analysis sample, n being superior to one; and determining the quantitative parameter of the compound using the n intensity measurements for the analysis sample.
    Type: Grant
    Filed: November 10, 2008
    Date of Patent: February 26, 2013
    Assignee: The Royal Institute for the Advancement of Learning/McGill University
    Inventors: David H. Burns, Fabiano Pandozzi
  • QUANTIFICATION OF AN ABSORBER THROUGH A SCATTERING MEDIUM
    Publication number: 20100249664
    Abstract: There is described a method for determining a quantitative parameter of a compound in an analysis sample, comprising: providing a scattering medium in physical contact with the analysis sample, the scattering medium having at least one layer, an index of refraction of the scattering medium being superior to an index of refraction of the analysis sample; propagating, in the scattering medium, an incident beam of light having a wavelength substantially corresponding to an absorption wavelength of the compound such that an evanescent wave is generated at an interface between the scattering medium and the analysis sample; taking n intensity measurements of a reflected beam of light for the analysis sample, n being superior to one; and determining the quantitative parameter of the compound using the n intensity measurements for the analysis sample.
    Type: Application
    Filed: November 10, 2008
    Publication date: September 30, 2010
    Applicant: THE ROYAL INSTITUTION FOR THE ADVANCEMENT OF LEARN
    Inventors: David H. Burns, Fabiano Pandozzi