Patents by Inventor Fabio Altomare

Fabio Altomare has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11957065
    Abstract: Various techniques and apparatus permit fabrication of superconductive circuits. A superconducting integrated circuit comprising a superconducting stud via, a kinetic inductor, and a capacitor may be formed. Forming a superconducting stud via in a superconducting integrated circuit may include masking with a hard mask and masking with a soft mask. Forming a superconducting stud via in a superconducting integrated circuit may include depositing a dielectric etch stop layer. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by an electrical vernier. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by a chain of electrical verniers and a Wheatstone bridge. A superconducting integrated circuit with three or more metal layers may include an enclosed, matched, on-chip transmission line. A metal wiring layer in a superconducting integrated circuit may be encapsulated.
    Type: Grant
    Filed: May 17, 2021
    Date of Patent: April 9, 2024
    Assignee: 1372934 B.C. LTD.
    Inventors: Shuiyuan Huang, Byong H. Oh, Douglas P. Stadtler, Edward G. Sterpka, Paul I. Bunyk, Jed D. Whittaker, Fabio Altomare, Richard G. Harris, Colin C. Enderud, Loren J. Swenson, Nicolas C. Ladizinsky, Jason J. Yao, Eric G. Ladizinsky
  • Publication number: 20240057485
    Abstract: A system, comprising a superconducting integrated circuit and a controller, may be operated to apply, for each power level of a sequence of discrete power levels on a respective one of a plurality of power lines, one or more pulses via a respective one of a plurality of addressing lines to a respective compound Josephson junction of each of a plurality of flux storage devices of the superconducting integrated circuit to cause each of the plurality of flux storage devices to reset. Power levels may be based at least in part on an estimated worst-case asymmetry between Josephson junctions of the compound Josephson junctions. The system may be operated to partition the plurality of addressing lines into groups, and apply a respective sequence of pulses to each addressing line of each pairwise combination of groups to cause one or more of the plurality of flux storage devices to reset.
    Type: Application
    Filed: December 16, 2021
    Publication date: February 15, 2024
    Inventors: Fabio Altomare, Andrew J. Berkley, Ilya V. Perminov, Mauricio Reis Filho
  • Patent number: 11288073
    Abstract: A hybrid processor includes a classical (digital) processor and a quantum processor and implements a calibration procedure to calibrate devices in the quantum processor. Parameter measurements are defined as vertices in a directed acyclic graph. Dependencies between measurements are defined as directed edges between vertices. The calibration procedure orders the vertices, respecting the order of the dependencies while at least attempting to reduce the time needed to perform all the measurements. The calibration procedure provides a level of abstraction to allow non-expert users to use the calibration procedure. Each vertex has a set of attributes defining the status of the measurement, time of the measurement and value of the measurement.
    Type: Grant
    Filed: April 21, 2020
    Date of Patent: March 29, 2022
    Assignee: D-WAVE SYSTEMS INC.
    Inventors: Andrew J. Berkley, Ilya V. Perminov, Mark W. Johnson, Christopher B. Rich, Fabio Altomare, Trevor M. Lanting
  • Publication number: 20210384406
    Abstract: Various techniques and apparatus permit fabrication of superconductive circuits. A superconducting integrated circuit comprising a superconducting stud via, a kinetic inductor, and a capacitor may be formed. Forming a superconducting stud via in a superconducting integrated circuit may include masking with a hard mask and masking with a soft mask. Forming a superconducting stud via in a superconducting integrated circuit may include depositing a dielectric etch stop layer. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by an electrical vernier. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by a chain of electrical verniers and a Wheatstone bridge. A superconducting integrated circuit with three or more metal layers may include an enclosed, matched, on-chip transmission line. A metal wiring layer in a superconducting integrated circuit may be encapsulated.
    Type: Application
    Filed: May 17, 2021
    Publication date: December 9, 2021
    Inventors: Shuiyuan Huang, Byong H. Oh, Douglas P. Stadtler, Edward G. Sterpka, Paul I. Bunyk, Jed D. Whittaker, Fabio Altomare, Richard G. Harris, Colin C. Enderud, Loren J. Swenson, Nicolas C. Ladizinsky, Jason J. Yao, Eric G. Ladizinsky
  • Patent number: 11038095
    Abstract: Various techniques and apparatus permit fabrication of superconductive circuits. A superconducting integrated circuit comprising a superconducting stud via, a kinetic inductor, and a capacitor may be formed. Forming a superconducting stud via in a superconducting integrated circuit may include masking with a hard mask and masking with a soft mask. Forming a superconducting stud via in a superconducting integrated circuit may include depositing a dielectric etch stop layer. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by an electrical vernier. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by a chain of electrical verniers and a Wheatstone bridge. A superconducting integrated circuit with three or more metal layers may include an enclosed, matched, on-chip transmission line. A metal wiring layer in a superconducting integrated circuit may be encapsulated.
    Type: Grant
    Filed: January 31, 2018
    Date of Patent: June 15, 2021
    Assignee: D-WAVE SYSTEMS INC.
    Inventors: Shuiyuan Huang, Byong H. Oh, Douglas P. Stadtler, Edward G. Sterpka, Paul I. Bunyk, Jed D. Whittaker, Fabio Altomare, Richard G. Harris, Colin C. Enderud, Loren J. Swenson, Nicolas C. Ladizinsky, Jason J. Yao, Eric G. Ladizinsky
  • Publication number: 20200379768
    Abstract: A hybrid processor includes a classical (digital) processor and a quantum processor and implements a calibration procedure to calibrate devices in the quantum processor. Parameter measurements are defined as vertices in a directed acyclic graph. Dependencies between measurements are defined as directed edges between vertices. The calibration procedure orders the vertices, respecting the order of the dependencies while at least attempting to reduce the time needed to perform all the measurements. The calibration procedure provides a level of abstraction to allow non-expert users to use the calibration procedure. Each vertex has a set of attributes defining the status of the measurement, time of the measurement and value of the measurement.
    Type: Application
    Filed: April 21, 2020
    Publication date: December 3, 2020
    Inventors: Andrew J. Berkley, Ilya V. Perminov, Mark W. Johnson, Christopher B. Rich, Fabio Altomare, Trevor M. Lanting
  • Publication number: 20200144476
    Abstract: Various techniques and apparatus permit fabrication of superconductive circuits. A superconducting integrated circuit comprising a superconducting stud via, a kinetic inductor, and a capacitor may be formed. Forming a superconducting stud via in a superconducting integrated circuit may include masking with a hard mask and masking with a soft mask. Forming a superconducting stud via in a superconducting integrated circuit may include depositing a dielectric etch stop layer. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by an electrical vernier. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by a chain of electrical verniers and a Wheatstone bridge. A superconducting integrated circuit with three or more metal layers may include an enclosed, matched, on-chip transmission line. A metal wiring layer in a superconducting integrated circuit may be encapsulated.
    Type: Application
    Filed: January 31, 2018
    Publication date: May 7, 2020
    Inventors: Shuiyuan Huang, Byong H. Oh, Douglas P. Stadtler, Edward G. Sterpka, Paul I. Bunyk, Jed D. Whittaker, Fabio Altomare, Richard G. Harris, Colin C. Enderud, Loren J. Swenson, Nicolas C. Ladizinsky, Jason J. Yao, Eric G. Ladizinsky